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Nedelec, JM
Turrell, S
Bouazaoui, M
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Nedelec, JM
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Capoen, B
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Turrell, S
Citation: C. Duverger et al., Waveguide Raman spectroscopy: a non-destructive tool for the characterization of amorphous thin films, J MOL STRUC, 481, 1999, pp. 169-178
Authors:
Benatsou, M
Capoen, B
Bouazaoui, M
Tchana, W
Vilcot, JP
Citation: M. Benatsou et al., Structural and optical properties of sol-gel derived aluminosilicate planar waveguides doped with Er3+ ions, J SOL-GEL S, 13(1-3), 1998, pp. 529-533