Authors:
Heyde, M
Cappella, B
Sturm, H
Ritter, C
Rademann, K
Citation: M. Heyde et al., Dislocation of antimony clusters on graphite by means of dynamic plowing nanolithography, SURF SCI, 476(1-2), 2001, pp. 54-62
Authors:
Heyde, M
Rademann, K
Cappella, B
Geuss, M
Sturm, H
Spangenberg, T
Niehus, H
Citation: M. Heyde et al., Dynamic plowing nanolithography on polymethylmethacrylate using an atomic force microscope, REV SCI INS, 72(1), 2001, pp. 136-141
Authors:
Kasas, S
Riederer, BM
Catsicas, S
Cappella, B
Dietler, G
Citation: S. Kasas et al., Fuzzy logic algorithm to extract specific interaction forces from atomic force microscopy data, REV SCI INS, 71(5), 2000, pp. 2082-2086
Authors:
Cappella, B
Baschieri, P
Ruffa, M
Ascoli, C
Relini, A
Rolandi, R
Citation: B. Cappella et al., Structure and nanomechanical properties of solvent cast stearic acid filmsin liquid: An atomic force microscopy study, LANGMUIR, 15(6), 1999, pp. 2152-2157