Authors: Heyde, M Cappella, B Sturm, H Ritter, C Rademann, K

Citation: M. Heyde et al., Dislocation of antimony clusters on graphite by means of dynamic plowing nanolithography, SURF SCI, 476(1-2), 2001, pp. 54-62

Authors: Heyde, M Rademann, K Cappella, B Geuss, M Sturm, H Spangenberg, T Niehus, H

Citation: M. Heyde et al., Dynamic plowing nanolithography on polymethylmethacrylate using an atomic force microscope, REV SCI INS, 72(1), 2001, pp. 136-141

Authors: Kasas, S Riederer, BM Catsicas, S Cappella, B Dietler, G

Citation: S. Kasas et al., Fuzzy logic algorithm to extract specific interaction forces from atomic force microscopy data, REV SCI INS, 71(5), 2000, pp. 2082-2086

Authors: Cappella, B Baschieri, P Ruffa, M Ascoli, C Relini, A Rolandi, R

Citation: B. Cappella et al., Structure and nanomechanical properties of solvent cast stearic acid filmsin liquid: An atomic force microscopy study, LANGMUIR, 15(6), 1999, pp. 2152-2157

Authors: Cappella, B Dietler, G

Citation: B. Cappella et G. Dietler, Force-distance curves by atomic force microscopy, SURF SCI R, 34(1-3), 1999, pp. 1