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Results: 1-13 |
Results: 13
Current-induced conditioning of hydrogenated amorphous carbon thin films for field emission
Authors: Carey, JD Silva, SRP
Citation: Jd. Carey et Srp. Silva, Current-induced conditioning of hydrogenated amorphous carbon thin films for field emission, DIAM RELAT, 10(3-7), 2001, pp. 873-877
Electron paramagnetic resonance study of ion implantation induced defects in amorphous hydrogenated carbon
Authors: Jones, BJ Barklie, RC Khan, RUA Carey, JD Silva, SRP
Citation: Bj. Jones et al., Electron paramagnetic resonance study of ion implantation induced defects in amorphous hydrogenated carbon, DIAM RELAT, 10(3-7), 2001, pp. 993-997
Electron delocalization in amorphous carbon by ion implantation - art. no.121201
Authors: Khan, RUA Carey, JD Silva, SRP Jones, BJ Barklie, RC
Citation: Rua. Khan et al., Electron delocalization in amorphous carbon by ion implantation - art. no.121201, PHYS REV B, 6312(12), 2001, pp. 1201
Field emission from amorphous semiconductors
Authors: Carey, JD Silva, SRP
Citation: Jd. Carey et Srp. Silva, Field emission from amorphous semiconductors, SOL ST ELEC, 45(6), 2001, pp. 1017-1024
Conditioning of hydrogenated amorphous carbon thin films for field emission via current stressing
Authors: Carey, JD Silva, SRP
Citation: Jd. Carey et Srp. Silva, Conditioning of hydrogenated amorphous carbon thin films for field emission via current stressing, APPL PHYS L, 78(3), 2001, pp. 347-349
Origin of electric field enhancement in field emission from amorphous carbon thin films
Authors: Carey, JD Forrest, RD Silva, SRP
Citation: Jd. Carey et al., Origin of electric field enhancement in field emission from amorphous carbon thin films, APPL PHYS L, 78(16), 2001, pp. 2339-2341
Modification of electron field emission properties from surface treated amorphous carbon thin films
Authors: Carey, JD Poa, CH Forrest, RD Burden, AP Silva, SRP
Citation: Jd. Carey et al., Modification of electron field emission properties from surface treated amorphous carbon thin films, J VAC SCI B, 18(2), 2000, pp. 1051-1053
Characterisation of defects in thin films of hydrogenated amorphous carbon
Authors: Collins, M Barklie, RC Anguita, JV Carey, JD Silva, SRP
Citation: M. Collins et al., Characterisation of defects in thin films of hydrogenated amorphous carbon, DIAM RELAT, 9(3-6), 2000, pp. 781-785
Influence of sp(2) clusters on the field emission properties of amorphous carbon thin films
Authors: Carey, JD Forrest, RD Khan, RUA Silva, SRP
Citation: Jd. Carey et al., Influence of sp(2) clusters on the field emission properties of amorphous carbon thin films, APPL PHYS L, 77(13), 2000, pp. 2006-2008
Structure of Er-related centers in Si
Authors: Carey, JD Priolo, F
Citation: Jd. Carey et F. Priolo, Structure of Er-related centers in Si, PHYSICA B, 274, 1999, pp. 350-353
Electron paramagnetic resonance and photoluminescence study of Er-impuritycomplexes in Si
Authors: Carey, JD Barklie, RC Donegan, JF Priolo, F Franzo, G Coffa, S
Citation: Jd. Carey et al., Electron paramagnetic resonance and photoluminescence study of Er-impuritycomplexes in Si, PHYS REV B, 59(4), 1999, pp. 2773-2782
A case-control study of the factors associated with spontaneous resolutionof hepatitis C viremia
Authors: Quinn, PG Jamal, MM Carey, JD Arora, S Harris, T Johnston, DE Sonnenberg, A
Citation: Pg. Quinn et al., A case-control study of the factors associated with spontaneous resolutionof hepatitis C viremia, AM J GASTRO, 94(3), 1999, pp. 668-673
EPR study of erbium-impurity complexes in silicon
Authors: Carey, JD Barklie, RC Donegan, JF Priolo, F Franzo, G Coffa, S
Citation: Jd. Carey et al., EPR study of erbium-impurity complexes in silicon, J LUMINESC, 80(1-4), 1998, pp. 297-301
Risultati: 1-13 |