Authors: Polignano, ML Alessandri, M Crivelli, B Zonca, R Caricato, AP Bersani, M Sbetti, M Vanzetti, L

Citation: Ml. Polignano et al., The impact of the nitridation process on the properties of the Si-SiO2 interface, J NON-CRYST, 280(1-3), 2001, pp. 39-47

Authors: Polignano, ML Caricato, AP Modelli, A Zonca, R

Citation: Ml. Polignano et al., Surface characterization by photocurrent measurements, APPL SURF S, 154, 2000, pp. 276-282

Authors: Cerofolini, GF Caricato, AP Meda, L Re, N Sgamellotti, A

Citation: Gf. Cerofolini et al., Quantum-mechanical study of nitrogen bonding configurations at the nitrided Si-SiO2 interface via model molecules, PHYS REV B, 61(20), 2000, pp. 14157-14166

Authors: Polignano, ML Caricato, AP Modelli, A Zonca, R

Citation: Ml. Polignano et al., A novel method for the simultaneous characterization of bulk impurities and surface states by photocurrent measurements, J ELCHEM SO, 147(4), 2000, pp. 1577-1582

Authors: Polignano, ML Bellafiore, N Caputo, D Caricato, AP Modelli, A Zonca, R

Citation: Ml. Polignano et al., Surface recombination velocity from photocurrent measurements - Validationand applications, J ELCHEM SO, 146(12), 1999, pp. 4640-4646