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Results: 1-9 |
Results: 9
Sol-gel processing of Au nanoparticles in bulk 10% B2O3-90% SiO2 glass
Authors: Epifani, M Carlino, E Blasi, C Giannini, C Tapfer, L Vasanelli, L
Citation: M. Epifani et al., Sol-gel processing of Au nanoparticles in bulk 10% B2O3-90% SiO2 glass, CHEM MATER, 13(5), 2001, pp. 1533-1539
Surface nanostructuring and damage morphologies along 2 GeV gold-ion-implanted tracks
Authors: Gozzelino, L Gerbaldo, R Ghigo, G Mezzetti, E Minetti, B Schatzle, P Krabbes, G Carlino, E Cuttone, G
Citation: L. Gozzelino et al., Surface nanostructuring and damage morphologies along 2 GeV gold-ion-implanted tracks, PHIL MAG B, 80(5), 2000, pp. 1015-1024
Investigation of the vortex confinement mechanisms in melt-textured YBa2Cu3O7-x with ion-induced surface nanostructuring
Authors: Gozzelino, L Gerbaldo, R Ghigo, G Mezzetti, E Minetti, B Schatzle, P Krabbes, G Carlino, E Rovelli, A
Citation: L. Gozzelino et al., Investigation of the vortex confinement mechanisms in melt-textured YBa2Cu3O7-x with ion-induced surface nanostructuring, PHIL MAG B, 80(5), 2000, pp. 1025-1038
Transmission electron microscopy studies of the microstructure of Si layers grown on GaAs(001) under an excess As or Al flux
Authors: Carlino, E Sorba, L Franciosi, A Heun, S Muller, BH
Citation: E. Carlino et al., Transmission electron microscopy studies of the microstructure of Si layers grown on GaAs(001) under an excess As or Al flux, PHIL MAG B, 80(5), 2000, pp. 1055-1069
Structural properties of (GaIn)(AsN)/GaAs MQW structures grown by MOVPE
Authors: Giannini, C Carlino, E Tapfer, L Hohnsdorf, F Koch, J Stolz, W
Citation: C. Giannini et al., Structural properties of (GaIn)(AsN)/GaAs MQW structures grown by MOVPE, MRS I J N S, 5, 2000, pp. NIL_222-NIL_227
Special issue: Proceedings of the workshop "microanalytical characterisation of semi-conducting materials and devices" - Preface
Authors: Armigliato, A Carlino, E Catalano, M
Citation: A. Armigliato et al., Special issue: Proceedings of the workshop "microanalytical characterisation of semi-conducting materials and devices" - Preface, MICRON, 31(3), 2000, pp. 201-201
High resolution transmission electron microscopy to study very thin crystalline layers buried at an amorphous-crystalline interface
Authors: Re, M Carlino, E Sorba, L Franciosi, A Muller, BH
Citation: M. Re et al., High resolution transmission electron microscopy to study very thin crystalline layers buried at an amorphous-crystalline interface, MICRON, 31(3), 2000, pp. 237-243
Defects and self-organized vortices in melt-textured YBa2Cu3O7-x
Authors: Gozzelino, L Gerbaldo, R Ghigo, G Mezzetti, E Minetti, B Carlino, E Krabbes, G Schaetzle, P Cuttone, G Rovelli, A
Citation: L. Gozzelino et al., Defects and self-organized vortices in melt-textured YBa2Cu3O7-x, SUPERCOND S, 12(12), 1999, pp. 1075-1078
Influence of the interface layer on the strain relaxation of ZnSe epitaxial layers grown by MBE on (001)GaAs
Authors: Giannini, C Carlino, E Sciacovelli, P Tapfer, L Sauvage-Simkin, M Garreau, Y Jedrecy, N Veron, MB Pinchaux, R
Citation: C. Giannini et al., Influence of the interface layer on the strain relaxation of ZnSe epitaxial layers grown by MBE on (001)GaAs, J PHYS D, 32(10A), 1999, pp. A51-A55
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