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Results:
1-18
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Results: 18
Authors:
Castle, JE
Salvi, AM
Citation: Je. Castle et Am. Salvi, Interpretation of the Shirley background in x-ray photoelectron spectroscopy analysis, J VAC SCI A, 19(4), 2001, pp. 1170-1175
Authors:
Castle, JE
Salvi, AM
Citation: Je. Castle et Am. Salvi, Chemical state information from the near-peak region of the X-ray photoelectron background, J ELEC SPEC, 114, 2001, pp. 1103-1113
Authors:
Diplas, S
Watts, JF
Morton, SA
Beamson, G
Tsakiropoulos, P
Clark, DT
Castle, JE
Citation: S. Diplas et al., Electron spectroscopy with CrK beta photons: high energy XPS and X-AES, J ELEC SPEC, 113(2-3), 2001, pp. 153-166
Authors:
Castle, JE
Salvi, AM
Guascito, MR
Citation: Je. Castle et al., Analysis of the x-ray photoelectron energy-loss background in silicides, SURF INT AN, 31(9), 2001, pp. 881-889
Authors:
Castle, JE
Greaves, SJ
Guascito, MR
Salvi, AM
Citation: Je. Castle et al., An X-ray photoelectron study of valence charge in transition metal aluminides, PHIL MAG A, 80(10), 2000, pp. 2425-2444
Authors:
Singjai, P
Zhdan, PA
Castle, JE
Citation: P. Singjai et al., Observations on the full honeycomb structure of graphite as imaged by atomic force microscopy, PHIL MAG A, 80(10), 2000, pp. 2445-2456
Authors:
Watts, JF
Leadley, SR
Castle, JE
Blomfield, CJ
Citation: Jf. Watts et al., Adsorption of PMMA on oxidized Al and Si substrates: An investigation by high-resolution X-ray photoelectron spectroscopy, LANGMUIR, 16(5), 2000, pp. 2292-2300
Authors:
Castle, JE
Chapman-Kpodo, H
Proctor, A
Salvi, AM
Citation: Je. Castle et al., Curve-fitting in XPS using extrinsic and intrinsic background structure, J ELEC SPEC, 106(1), 2000, pp. 65-80
Authors:
Castle, JE
Greaves, SJ
Guascito, MR
Salvi, AM
Citation: Je. Castle et al., A new probe of bonding states in intermetallic compounds, PHIL MAG A, 79(5), 1999, pp. 1109-1129
Authors:
Simpson, TRE
Watts, JF
Zhdan, PA
Castle, JE
Digby, RP
Citation: Tre. Simpson et al., A combined atomic force microscopy (AFM)/X-ray photoelectron spectroscopy (XPS) study of organosilane molecules adsorbed on the aluminium alloy L157-T6, J MAT CHEM, 9(11), 1999, pp. 2935-2941
Authors:
Castle, JE
Baker, MA
Citation: Je. Castle et Ma. Baker, The feasibility of an XPS expert system demonstrated by a rule set for carbon contamination, J ELEC SPEC, 105(2-3), 1999, pp. 245-256
Authors:
Vickers, PE
Castle, JE
Watts, JF
Citation: Pe. Vickers et al., Quantification routines for adsorption studies in static secondary ion mass spectrometry and the effect of ionisation probability, APPL SURF S, 150(1-4), 1999, pp. 244-254
Authors:
Watts, JF
Castle, JE
Citation: Jf. Watts et Je. Castle, The determination of adsorption isotherms by XPS and ToF-SIMS: their role in adhesion science, INT J ADHES, 19(6), 1999, pp. 435-443
Authors:
Castle, JE
Salvi, AM
Guascito, MR
Citation: Je. Castle et al., Substrate-related feature in the loss structure of contamination C 1s, SURF INT AN, 27(8), 1999, pp. 753-760
Authors:
Castle, JE
Zhdan, PA
Singjai, P
Citation: Je. Castle et al., Atomic force microscopy imaging of chloride ions adsorbed on etched polycrystalline copper in dilute HCl, SURF INT AN, 27(8), 1999, pp. 770-775
Authors:
Salvi, AM
Castle, JE
Citation: Am. Salvi et Je. Castle, The intrinsic asymmetry component of the 'total background' in XP spectra (vol 94, pg 73, 1998), J ELEC SPEC, 97(3), 1998, pp. 265-265
Authors:
Salvi, AM
Castle, JE
Citation: Am. Salvi et Je. Castle, The intrinsic asymmetry of photoelectron peaks: dependence on chemical state and role in curve fitting (vol 95, pg 45, 1998), J ELEC SPEC, 95(2-3), 1998, pp. 299-299
Authors:
Castle, JE
Zhdan, PA
Singjai, P
Citation: Je. Castle et al., Enhanced morphological reconstruction of SPM images, J PHYS D, 31(24), 1998, pp. 3437-3445
Risultati:
1-18
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