Citation: J. Bandet et al., Raman analysis of wurtzite silicon islands in silicon oxide deposited in N2O-SiH4 plasma process, JPN J A P 2, 39(2B), 2000, pp. L141-L142
Citation: J. Bandet et al., Nitrogen bonding environments and local order in hydrogenated amorphous silicon nitride films studied by Raman spectroscopy, J APPL PHYS, 85(11), 1999, pp. 7899-7904