Authors:
Basile, G
Becker, P
Bergamin, A
Cavagnero, G
Franks, A
Jackson, K
Kuetgens, U
Mana, G
Palmer, EW
Robbie, CJ
Stedman, M
Stumpel, J
Yacoot, A
Zosi, G
Citation: G. Basile et al., Combined optical and X-ray interferometry for high-precision dimensional metrology, P ROY SOC A, 456(1995), 2000, pp. 701-729
Authors:
Bergamin, A
Cavagnero, G
Mana, G
Massa, E
Zosi, G
Citation: A. Bergamin et al., Measuring small lattice distortions in Si-crystals by phase-contrast x-raytopography, J PHYS D, 33(21), 2000, pp. 2678-2682
Citation: A. Bergamin et al., Scanning X-ray interferometry and the silicon lattice parameter: towards 10(-9) relative uncertainty?, EUR PHY J B, 9(2), 1999, pp. 225-232
Authors:
Bergamin, A
Cavagnero, G
Mana, G
Massa, E
Zosi, G
Citation: A. Bergamin et al., Optically polished surfaces parallel to the (220) lattice planes of silicon monocrystals, MEAS SCI T, 10(6), 1999, pp. 549-553
Authors:
Bergamin, A
Cavagnero, G
Mana, G
Massa, E
Zosi, G
Citation: A. Bergamin et al., Optically polished surfaces parallel to the (220) lattice planes of silicon monocrystals (vol 10, pg 549, 1999), MEAS SCI T, 10(12), 1999, pp. 1353-1353