AAAAAA

   
Results: 1-11 |
Results: 11
Thin oxide degradation after high-energy ion irradiation
Authors: Candelori, A Ceschia, M Paccagnella, A Wyss, J Bisello, D Ghidini, G
Citation: A. Candelori et al., Thin oxide degradation after high-energy ion irradiation, IEEE NUCL S, 48(5), 2001, pp. 1735-1743
Electrically and radiation induced leakage currents in thin oxides
Authors: Scarpa, A Riess, P Ghibaudo, G Paccagnella, A Pananakakis, G Ceschia, M Ghidini, G
Citation: A. Scarpa et al., Electrically and radiation induced leakage currents in thin oxides, MICROEL REL, 40(1), 2000, pp. 57-67
Forecasting of the flowering time for wild species observed at Guidonia, central Italy
Authors: Cenci, CA Ceschia, M
Citation: Ca. Cenci et M. Ceschia, Forecasting of the flowering time for wild species observed at Guidonia, central Italy, INT J BIOM, 44(2), 2000, pp. 88-96
Heavy ion irradiation of thin gate oxides
Authors: Ceschia, M Paccagnella, A Turrini, M Candelori, A Ghidini, G Wyss, J
Citation: M. Ceschia et al., Heavy ion irradiation of thin gate oxides, IEEE NUCL S, 47(6), 2000, pp. 2648-2655
Low field leakage current and soft breakdown in ultra-thin gate oxides after heavy ions, electrons or X-ray irradiation
Authors: Ceschia, M Paccagnella, A Sandrin, S Ghidini, G Wyss, J Lavale, M Flament, O
Citation: M. Ceschia et al., Low field leakage current and soft breakdown in ultra-thin gate oxides after heavy ions, electrons or X-ray irradiation, IEEE NUCL S, 47(3), 2000, pp. 566-573
Comparison of the electrical and thermal stability of stress- or radiation-induced leakage current in thin oxides
Authors: Riess, P Ceschia, M Paccagnella, A Ghibaudo, G Pananakakis, G
Citation: P. Riess et al., Comparison of the electrical and thermal stability of stress- or radiation-induced leakage current in thin oxides, APPL PHYS L, 76(9), 2000, pp. 1158-1160
Total dose dependence of radiation-induced leakage current in ultra-thin gate oxides
Authors: Ceschia, M Paccagnella, A Scarpa, A Cester, A Ghidini, G
Citation: M. Ceschia et al., Total dose dependence of radiation-induced leakage current in ultra-thin gate oxides, MICROEL REL, 39(2), 1999, pp. 221-226
Low-field current on thin oxides after constant current or radiation stresses
Authors: Ceschia, M Paccagnella, A Cester, A Scarpa, A Candelori, A Ghidini, G
Citation: M. Ceschia et al., Low-field current on thin oxides after constant current or radiation stresses, J NON-CRYST, 245, 1999, pp. 232-237
Electron irradiation effects on thin MOS capacitors
Authors: Candelori, A Paccagnella, A Cammarata, M Ghidini, G Ceschia, M
Citation: A. Candelori et al., Electron irradiation effects on thin MOS capacitors, J NON-CRYST, 245, 1999, pp. 238-244
A model of Radiation Induced Leakage Current (RILC) in ultra-thin gate oxides
Authors: Larcher, L Paccagnella, A Ceschia, M Ghidini, G
Citation: L. Larcher et al., A model of Radiation Induced Leakage Current (RILC) in ultra-thin gate oxides, IEEE NUCL S, 46(6), 1999, pp. 1553-1561
Radiation induced leakage current and stress induced leakage current in ultra-thin gate oxides
Authors: Ceschia, M Paccagnella, A Cester, A Scarpa, A Ghidini, G
Citation: M. Ceschia et al., Radiation induced leakage current and stress induced leakage current in ultra-thin gate oxides, IEEE NUCL S, 45(6), 1998, pp. 2375-2382
Risultati: 1-11 |