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Results:
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Results: 2
A new high sensitive method for determining weak microinhomogeneities in semiconductors
Authors:
Chaikovsky, I Alperovich, L Gurvich, Y Melnikov, A
Citation:
I. Chaikovsky et al., A new high sensitive method for determining weak microinhomogeneities in semiconductors, MAT SC S PR, 4(1-3), 2001, pp. 323-326
An analysis of weak inhomogeneities in the strong magnetic fields
Authors:
Alperovich, L Chaikovsky, I Gurvich, Y Melnikov, A
Citation:
L. Alperovich et al., An analysis of weak inhomogeneities in the strong magnetic fields, PHYSICA B, 298(1-4), 2001, pp. 364-368
Risultati:
1-2
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