Authors:
Nurgaliev, T
Chakalov, RA
Ivanov, Z
Spasov, A
Wu, Z
Davis, LE
Citation: T. Nurgaliev et al., Characteristics of smooth and periodic HTS coplanar resonators on ferroelectric/dielectric substrates, IEEE APPL S, 11(3), 2001, pp. 4102-4105
Authors:
Vlakhov, ES
Dorr, K
Muller, KH
Nenkov, KA
Handstein, A
Walter, T
Chakalov, RA
Chakalova, RI
Donchev, TI
Spasov, AY
Citation: Es. Vlakhov et al., Temperature dependence of low-field magnetoresistance in perovskite manganites thin films, VACUUM, 58(2-3), 2000, pp. 404-407
Authors:
Nurgaliev, T
Chakalov, RA
Ivanov, Z
Spasov, A
Citation: T. Nurgaliev et al., Investigation of microwave current effect on parameters of YBCO thin filmsin microstrip resonator structure, PHYSICA C, 315(1-2), 1999, pp. 71-78
Authors:
Abrashev, MV
Ivanov, VG
Iliev, MN
Chakalov, RA
Chakalova, RI
Thomsen, C
Citation: Mv. Abrashev et al., Raman study of the variations of the Jahn-Teller distortions through the metal-insulator transition in magnetoresistive La0.7Ca0.3MnO3 thin films, PHYS ST S-B, 215(1), 1999, pp. 631-636
Authors:
Abrashev, MV
Litvinchuk, AP
Iliev, MN
Meng, RL
Popov, VN
Ivanov, VG
Chakalov, RA
Thomsen, C
Citation: Mv. Abrashev et al., Comparative study of optical phonons in the rhombohedrally distorted perovskites LaAlO3 and LaMnO3, PHYS REV B, 59(6), 1999, pp. 4146-4153
Citation: Pk. Petrov et al., Three-dimensional Monte Carlo simulation of sputtered atom transport in the process of ion-plasma sputter deposition of multicomponent thin films, VACUUM, 52(4), 1999, pp. 427-434
Authors:
Chakalov, RA
Ivanov, ZG
Boikov, YA
Larsson, P
Carlsson, E
Gevorgian, S
Claeson, T
Citation: Ra. Chakalov et al., Fabrication and investigation of YBa2Cu3O7-delta/Ba0.05Sr0.95TiO3 thin film structures for voltage tunable devices, PHYSICA C, 308(3-4), 1998, pp. 279-288
Authors:
Dorr, K
Muller, KH
Vlakhov, ES
Chakalov, RA
Chakalova, RI
Nenkov, KA
Handstein, A
Holzapfel, B
Schultz, L
Citation: K. Dorr et al., Magnetoresistance effects of La0.7M0.3MnO3-delta far below the Curie temperature (M = Ca, Pb), J APPL PHYS, 83(11), 1998, pp. 7079-7081