Citation: V. Lysenko et al., Stress relaxation effect in porous 3C-SiC/Si heterostructure by micro-Raman spectroscopy, APPL PHYS L, 79(15), 2001, pp. 2366-2368
Authors:
Perichon, S
Lysenko, V
Roussel, P
Remaki, B
Champagnon, B
Barbier, D
Pinard, P
Citation: S. Perichon et al., Technology and micro-Raman characterization of thick meso-porous silicon layers for thermal effect microsystems, SENS ACTU-A, 85(1-3), 2000, pp. 335-339
Authors:
Melinon, P
Keghelian, P
Perez, A
Champagnon, B
Guyot, Y
Saviot, L
Reny, E
Cros, C
Pouchard, M
Dianoux, AJ
Citation: P. Melinon et al., Phonon density of states of silicon clathrates: Characteristic width narrowing effect with respect to the diamond phase, PHYS REV B, 59(15), 1999, pp. 10099-10104
Authors:
Ikeda, T
Fukazawa, H
Mae, S
Pepin, L
Duval, P
Champagnon, B
Lipenkov, VY
Hondoh, T
Citation: T. Ikeda et al., Extreme fractionation of gases caused by formation of clathrate hydrates in Vostok Antarctic ice, GEOPHYS R L, 26(1), 1999, pp. 91-94
Citation: C. Chemarin et B. Champagnon, Medium range order in sodium silicate glasses: role of the network modifier, J NON-CRYST, 243(2-3), 1999, pp. 281-284
Authors:
Lysenko, V
Perichon, S
Remaki, B
Barbier, D
Champagnon, B
Citation: V. Lysenko et al., Thermal conductivity of thick meso-porous silicon layers by micro-Raman scattering, J APPL PHYS, 86(12), 1999, pp. 6841-6846