Authors:
Kholkin, AL
Akdogan, EK
Safari, A
Chauvy, PF
Setter, N
Citation: Al. Kholkin et al., Characterization of the effective electrostriction coefficients in ferroelectric thin films, J APPL PHYS, 89(12), 2001, pp. 8066-8073
Citation: Pf. Chauvy et al., Variable length scale analysis of surface topography: characterization of titanium surfaces for biomedical applications, SURF COAT, 110(1-2), 1998, pp. 48-56