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Results: 1-9 |
Results: 9

Authors: Checchetto, R Tosello, C Miotello, A Principi, G
Citation: R. Checchetto et al., Structural evolution of Fe-Al multilayer thin films for different annealing temperatures, J PHYS-COND, 13(5), 2001, pp. 811-821

Authors: Checchetto, R Miotello, A Brusa, RS
Citation: R. Checchetto et al., Deuterium effusion from nanocrystalline boron nitride thin films, J PHYS-COND, 13(26), 2001, pp. 5853-5864

Authors: Checchetto, R Miotello, A Chayahara, A
Citation: R. Checchetto et al., Structure and optical properties of boron nitride thin films deposited by radio-frequency sputtering on polycarbonate, J PHYS-COND, 12(44), 2000, pp. 9215-9220

Authors: Checchetto, R Miotello, A
Citation: R. Checchetto et A. Miotello, Deuterium diffusion through hexagonal boron nitride thin films, J APPL PHYS, 87(1), 2000, pp. 110-116

Authors: Pastorelli, R Ossi, PM Bottani, CE Checchetto, R Miotello, A
Citation: R. Pastorelli et al., Elastic constants of cubic boron nitride films, APPL PHYS L, 77(14), 2000, pp. 2168-2170

Authors: Brusa, RS Deng, W Checchetto, R Karwasz, GP Zecca, A
Citation: Rs. Brusa et al., Copper thin films used as transmission remoderators for slow positron beams, APPL PHYS L, 76(11), 2000, pp. 1476-1478

Authors: Checchetto, R Scardi, P
Citation: R. Checchetto et P. Scardi, Structural characterization of deuterated titanium thin films, J MATER RES, 14(5), 1999, pp. 1969-1976

Authors: Checchetto, R Miotello, A Tomasi, A
Citation: R. Checchetto et al., Differential scanning calorimetry and thermal desorption analysis of crystalline synthetic quartz, CHEM P LETT, 306(5-6), 1999, pp. 330-334

Authors: Bonizzi, A Checchetto, R Miotello, A Ossi, PM
Citation: A. Bonizzi et al., Low-temperature deposition of cubic boron nitride thin films, EUROPH LETT, 44(5), 1998, pp. 627-633
Risultati: 1-9 |