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Results: 1-1 |
Results: 1

Authors: Heo, D Gebara, E Chen, UJE Yoo, SY Hamai, M Suh, Y Laskar, J
Citation: D. Heo et al., An improved deep submicrometer MOSFET RF nonlinear model with new breakdown current model and drain-to-substrate nonlinear coupling, IEEE MICR T, 48(12), 2000, pp. 2361-2369
Risultati: 1-1 |