Authors:
Heo, D
Gebara, E
Chen, UJE
Yoo, SY
Hamai, M
Suh, Y
Laskar, J
Citation: D. Heo et al., An improved deep submicrometer MOSFET RF nonlinear model with new breakdown current model and drain-to-substrate nonlinear coupling, IEEE MICR T, 48(12), 2000, pp. 2361-2369