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Results:
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Results: 8
Authors:
Chenevier, B
Chaix-Pluchery, O
Matko, I
Madar, R
La Via, F
Citation: B. Chenevier et al., Structural investigations of the C49-C54 transformation in TiSi2 thin films, MICROEL ENG, 55(1-4), 2001, pp. 115-122
Authors:
Chenevier, B
Chaix-Pluchery, O
Matko, I
Senateur, JP
Madar, R
La Via, F
Citation: B. Chenevier et al., In situ investigations of the metal/silicon reaction in Ti/Si thin films capped with TiN: Volumetric analysis of the C49-C54 transformation, APPL PHYS L, 79(14), 2001, pp. 2184-2186
Authors:
Gaidi, M
Chenevier, B
Labeau, M
Citation: M. Gaidi et al., Electrical properties evolution under reducing gaseous mixtures (H-2, H2S,CO) of SnO2 thin films doped with Pd/Pt aggregates and used as polluting gas sensors, SENS ACTU-B, 62(1), 2000, pp. 43-48
Authors:
Gaidi, M
Hazemann, JL
Matko, I
Chenevier, B
Rumyantseva, M
Gaskov, A
Labeau, M
Citation: M. Gaidi et al., Role of Pt aggregates in Pt/SnO2 thin films used as gas sensors - Investigations of the catalytic effect, J ELCHEM SO, 147(8), 2000, pp. 3131-3138
Authors:
Hishinuma, Y
Kitaguchi, H
Kumakura, H
Itoh, K
Togano, K
Miao, HP
Chenevier, B
Citation: Y. Hishinuma et al., Local J(c) distribution in superconducting oxide layer of Bi2Sr2CaCu2Ox/Agtapes, IEEE APPL S, 9(2), 1999, pp. 1908-1911
Authors:
Matko, I
Gaidi, M
Hazemann, JL
Chenevier, B
Labeau, M
Citation: I. Matko et al., Electrical properties under polluting gas (CO) of Pt- and Pd-doped polycrystalline SnO2 thin films: analysis of the metal aggregate size effect, SENS ACTU-B, 59(2-3), 1999, pp. 210-215
Authors:
Ikeda, S
Palleau, J
Torres, J
Chenevier, B
Bourhila, N
Madar, R
Citation: S. Ikeda et al., TEM studies of the microstructure evolution in plasma treated CVD TiN thinfilms used as diffusion barriers, SOL ST ELEC, 43(6), 1999, pp. 1063-1068
Authors:
Ikeda, S
Palleau, J
Torres, J
Chenevier, B
Bourhila, N
Madar, R
Citation: S. Ikeda et al., Film texture evolution in plasma treated TiN thin films, J APPL PHYS, 86(4), 1999, pp. 2300-2306
Risultati:
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