Authors: Lai, JM Chieng, WH Lin, BC Chin, A Tsai, C

Citation: Jm. Lai et al., The leakage current effect of thin gate oxides (2.4-2.7 nm) with in situ native oxide desorption, J ELCHEM SO, 146(6), 1999, pp. 2216-2218

Authors: Lai, JM Chieng, WH Huang, YC

Citation: Jm. Lai et al., Precision alignment of mask etching with respect to crystal orientation, J MICROM M, 8(4), 1998, pp. 327-329