Authors: Huang, YS Chao, CS Stetsko, YP Lee, YR Ching, CH Hung, CY Lin, GY Lin, TC Chang, SL

Citation: Ys. Huang et al., Substrate-mediated multiwave resonance grazing incidence x-ray diffractionin thin films: A method for direct phase determination - art. no. 085406, PHYS REV B, 6408(8), 2001, pp. 5406