Authors:
Young, PR
McPherson, DS
Chrisostomidis, C
Elgaid, K
Thayne, IG
Lucyszyn, S
Robertson, ID
Citation: Pr. Young et al., Accurate non-uniform transmission line model and its application to the de-embedding of on-wafer measurements, IEE P-MIC A, 148(3), 2001, pp. 153-156