Authors:
Giorgis, F
Chiodoni, A
Cicero, G
Ferrero, S
Mandracci, P
Barucca, G
Reitano, R
Musumeci, P
Citation: F. Giorgis et al., Optical and structural properties of SiC layers grown by an electron cyclotron resonance CVD technique, DIAM RELAT, 10(3-7), 2001, pp. 1264-1267