Authors: Paul, S Clough, FJ

Citation: S. Paul et Fj. Clough, A technique to investigate inhomogeneity in materials: An arrangement of microtip and scanning electron microscope, REV SCI INS, 72(9), 2001, pp. 3543-3545

Authors: Paul, S Clough, FJ

Citation: S. Paul et Fj. Clough, Schottky contacts on amorphous carbon: A more reliable approach, APPL PHYS L, 78(10), 2001, pp. 1415-1417

Authors: Maeng, SL Uchikoga, S Clough, FJ Tagliaferro, A Flewitt, AJ Robertson, J Milne, WI

Citation: Sl. Maeng et al., A carbon based bottom gate thin film transistor, DIAM RELAT, 9(3-6), 2000, pp. 805-810

Authors: Xu, YZ Clough, FJ Narayanan, EMS Chen, Y Milne, WI

Citation: Yz. Xu et al., Turn-on characteristics of polycrystalline silicon TFT's - Impact of hydrogenation and channel length, IEEE ELEC D, 20(2), 1999, pp. 80-82

Authors: Clough, FJ Paul, S Egret, S Robertson, J Milne, WI

Citation: Fj. Clough et al., Metal/diamond-like carbon/metal switches for active matrix flat panel displays - current status and optimisation, RRD APP PHY, 2, 1999, pp. 163-176

Authors: Paul, S Clough, FJ

Citation: S. Paul et Fj. Clough, Schottky barrier formation on rf-plasma enhanced chemical vapour depositedhydrogenated amorphous carbon, DIAM RELAT, 7(11-12), 1998, pp. 1734-1738