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Results: 1-25/26
Authors:
Lee, J
Rovira, PI
An, I
Collins, RW
Citation: J. Lee et al., Alignment and calibration of the MgF2 biplate compensator for applicationsin rotating-compensator multichannel ellipsometry, J OPT SOC A, 18(8), 2001, pp. 1980-1985
Authors:
Belanger, F
Collins, RW
Cheney, PH
Citation: F. Belanger et al., Technology requirements and work group communication for telecommuters, INF SYST R, 12(2), 2001, pp. 155-176
Authors:
Zapien, JA
Messier, R
Collins, RW
Citation: Ja. Zapien et al., Multichannel ellipsometry from 1.5 to 6.5 eV for real time characterization of wide band gap materials: phase identification in boron nitride thin films, DIAM RELAT, 10(3-7), 2001, pp. 1304-1310
Authors:
Collins, RW
Jones, JB
Walthall, JDH
Chisholm, CD
Giles, BK
Brizendine, EJ
Cordell, WH
Citation: Rw. Collins et al., Intravenous administration of prochlorperazine by 15-minute infusion versus 2-minute bolus does not affect the incidence of akathisia: A prospective,randomized, controlled trial, ANN EMERG M, 38(5), 2001, pp. 491-496
Authors:
Lee, J
Koh, J
Collins, RW
Citation: J. Lee et al., Dual rotating-compensator multichannel ellipsometer: Instrument development for high-speed Mueller matrix spectroscopy of surfaces and thin films, REV SCI INS, 72(3), 2001, pp. 1742-1754
Authors:
Zapien, JA
Messier, R
Collins, RW
Citation: Ja. Zapien et al., Ultraviolet-extended real-time spectroscopic ellipsometry for characterization of phase evolution in BN thin films, APPL PHYS L, 78(14), 2001, pp. 1982-1984
Authors:
Fujiwara, H
Koh, J
Rovira, PI
Collins, RW
Citation: H. Fujiwara et al., Assessment of effective-medium theories in the analysis of nucleation and microscopic surface roughness evolution for semiconductor thin films, PHYS REV B, 61(16), 2000, pp. 10832-10844
Authors:
Collins, RW
Koh, J
Fujiwara, H
Rovira, PI
Ferlauto, AS
Zapien, JA
Wronski, CR
Messier, R
Citation: Rw. Collins et al., Recent progress in thin film growth analysis by multichannel spectroscopicellipsometry, APPL SURF S, 154, 2000, pp. 217-228
Authors:
Lee, J
Koh, T
Collins, RW
Citation: J. Lee et al., Multichannel Mueller matrix ellipsometer for real-time spectroscopy of anisotropic surfaces and films, OPTICS LETT, 25(21), 2000, pp. 1573-1575
Authors:
Zapien, JA
Collins, RW
Messier, R
Citation: Ja. Zapien et al., Real-time spectroscopic ellipsometry from 1.5 to 6.5 eV, THIN SOL FI, 364(1-2), 2000, pp. 16-21
Authors:
Collins, RW
Koh, J
Ferlauto, AS
Rovira, PI
Lee, YH
Koval, RJ
Wronski, CR
Citation: Rw. Collins et al., Real time analysis of amorphous and microcrystalline silicon film growth by multichannel ellipsometry, THIN SOL FI, 364(1-2), 2000, pp. 129-137
Authors:
Zapien, JA
Collins, RW
Messier, R
Citation: Ja. Zapien et al., Multichannel ellipsometer for real time spectroscopy of thin film deposition from 1.5 to 6.5 eV, REV SCI INS, 71(9), 2000, pp. 3451-3460
Authors:
Koh, J
Ferlauto, AS
Rovira, PI
Koval, RJ
Wronski, CR
Collins, RW
Citation: J. Koh et al., Evolutionary phase diagrams for the deposition of silicon films from hydrogen-diluted silane, J NON-CRYST, 266, 2000, pp. 43-47
Authors:
Ferlauto, AS
Koh, J
Rovira, PI
Wronski, CR
Collins, RW
Ganguly, G
Citation: As. Ferlauto et al., Modeling the dielectric functions of silicon-based films in the amorphous,nanocrystalline and microcrystalline regimes, J NON-CRYST, 266, 2000, pp. 269-273
Authors:
Rovira, PI
Ferlauto, AS
Koh, J
Wronski, CR
Collins, RW
Citation: Pi. Rovira et al., Optics of textured amorphous silicon surfaces, J NON-CRYST, 266, 2000, pp. 279-283
Authors:
Yu, KS
Hamilton-Kemp, TR
Archbold, DD
Collins, RW
Newman, MC
Citation: Ks. Yu et al., Volatile compounds from Escherichia coli O157 : H7 and their absorption bystrawberry fruit, J AGR FOOD, 48(2), 2000, pp. 413-417
Authors:
Pearce, JM
Koval, RJ
Ferlauto, AS
Collins, RW
Wronski, CR
Yang, J
Guha, S
Citation: Jm. Pearce et al., Dependence of open-circuit voltage in hydrogenated protocrystalline silicon solar cells on carrier recombination in p/i interface and bulk regions, APPL PHYS L, 77(19), 2000, pp. 3093-3095
Authors:
Collins, RW
Citation: Rw. Collins, Psychological perspectives on security issues, PROTECTION, SECURITY, AND SAFEGUARDS, 2000, pp. 15-28
Authors:
Collins, RW
Koh, J
Citation: Rw. Collins et J. Koh, Dual rotating-compensator multichannel ellipsometer: instrument design forreal-time Mueller matrix spectroscopy of surfaces and films, J OPT SOC A, 16(8), 1999, pp. 1997-2006
Authors:
Koh, J
Fujiwara, H
Koval, RJ
Wronski, CR
Collins, RW
Citation: J. Koh et al., Real time spectroscopic ellipsometry studies of the nucleation and growth of p-type microcrystalline silicon films on amorphous silicon using B2H6, B(CH3)(3) and BF3 dopant source gases, J APPL PHYS, 85(8), 1999, pp. 4141-4153
Authors:
Rovira, PI
Collins, RW
Citation: Pi. Rovira et Rw. Collins, Analysis of specular and textured SnO2 : F films by high speed four-parameter Stokes vector spectroscopy, J APPL PHYS, 85(4), 1999, pp. 2015-2025
Authors:
Archbold, DD
Hamilton-Kemp, TR
Clements, AM
Collins, RW
Citation: Dd. Archbold et al., Fumigating 'Crimson Seedless' table grapes with (E)-2-hexenal reduces moldduring long-term postharvest storage, HORTSCIENCE, 34(4), 1999, pp. 705-707
Authors:
Koh, J
Ferlauto, AS
Rovira, PI
Wronski, CR
Collins, RW
Citation: J. Koh et al., Evolutionary phase diagrams for plasma-enhanced chemical vapor deposition of silicon thin films from hydrogen-diluted silane, APPL PHYS L, 75(15), 1999, pp. 2286-2288
Authors:
Koval, RJ
Koh, J
Lu, Z
Jiao, L
Collins, RW
Wronski, CR
Citation: Rj. Koval et al., Performance and stability of Si : H p-i-n solar cells with i layers prepared at the thickness-dependent amorphous-to-microcrystalline phase boundary, APPL PHYS L, 75(11), 1999, pp. 1553-1555
Authors:
Fujiwara, H
Koh, J
Wronski, CR
Collins, RW
Citation: H. Fujiwara et al., Analysis of contamination, hydrogen emission, and surface temperature variations using real time spectroscopic ellipsometry during p/i interface formation in amorphous silicon p-i-n solar cells, APPL PHYS L, 74(24), 1999, pp. 3687-3689