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Results: 1-2 |
Results: 2
Systematic development of transmission-line models for interconnects with frequency-dependent losses
Authors: Coperich, KM Morsey, J Okhmatovski, VI Cangellaris, AC Ruehli, DE
Citation: Km. Coperich et al., Systematic development of transmission-line models for interconnects with frequency-dependent losses, IEEE MICR T, 49(10), 2001, pp. 1677-1685
Enhanced skin effect for partial-element equivalent-circuit (PEEC) models
Authors: Coperich, KM Ruehli, AE Cangellaris, A
Citation: Km. Coperich et al., Enhanced skin effect for partial-element equivalent-circuit (PEEC) models, IEEE MICR T, 48(9), 2000, pp. 1435-1442
Risultati: 1-2 |