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Nobili, C
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Authors:
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Karwasz, GP
Tiengo, N
Zecca, A
Corni, F
Tonini, R
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Citation: Rs. Brusa et al., Formation of vacancy clusters and cavities in He-implanted silicon studiedby slow-positron annihilation spectroscopy, PHYS REV B, 61(15), 2000, pp. 10154-10166
Authors:
Gambetta, F
Frabboni, S
Tonini, R
Corni, F
Citation: F. Gambetta et al., Large angle convergent beam electron diffraction strain measurements in high dose helium implanted silicon, MAT SCI E B, 71, 2000, pp. 87-91
Authors:
Corni, F
Calzolari, G
Gambetta, F
Nobili, C
Tonini, R
Zapparoli, M
Citation: F. Corni et al., Evolution of vacancy-like defects in helium-implanted (100) silicon studied by thermal desorption spectrometry, MAT SCI E B, 71, 2000, pp. 207-212
Authors:
Rakvin, B
Pivac, B
Tonini, R
Corni, F
Ottaviani, G
Citation: B. Rakvin et al., Electron paramagnetic resonance study of S2 defects in hydrogen-implanted silicon, NUCL INST B, 170(1-2), 2000, pp. 125-133
Authors:
Brusa, RS
Karwasz, GP
Tiengo, N
Zecca, A
Corni, F
Calzolari, G
Nobili, C
Citation: Rs. Brusa et al., He-implantation induced defects in Si studied by slow positron annihilation spectroscopy, J APPL PHYS, 85(4), 1999, pp. 2390-2397
Authors:
Corni, F
Calzolari, G
Frabboni, S
Nobili, C
Ottaviani, G
Tonini, R
Cerofolini, GF
Leone, D
Servidori, M
Brusa, RS
Karwasz, GP
Tiengo, N
Zecca, A
Citation: F. Corni et al., Helium-implanted silicon: A study of bubble precursors, J APPL PHYS, 85(3), 1999, pp. 1401-1408