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Results: 1-4 |
Results: 4
First principles calculations of hydrogen annealed amorphous SiO2 structures and Si/SiO2 interface for non volatile memories
Authors: Courtot-Descharles, A Paillet, P Leray, JL Musseau, O
Citation: A. Courtot-descharles et al., First principles calculations of hydrogen annealed amorphous SiO2 structures and Si/SiO2 interface for non volatile memories, MAT SC S PR, 3(1-2), 2000, pp. 143-148
Density functional theory applied to the calculation of dielectric constant of low-k materials (vol 39, pg 279, 1999)
Authors: Courtot-Descharles, A Pires, F Paillet, P Leray, JL
Citation: A. Courtot-descharles et al., Density functional theory applied to the calculation of dielectric constant of low-k materials (vol 39, pg 279, 1999), MICROEL REL, 39(4), 1999, pp. 549-549
Density functional theory applied to the calculation of dielectric constant of low-k materials
Authors: Courtot-Descharles, A Pires, F Paillet, P Leray, JL
Citation: A. Courtot-descharles et al., Density functional theory applied to the calculation of dielectric constant of low-k materials, MICROEL REL, 39(2), 1999, pp. 279-284
Theoretical study using density functional theory of defects in amorphous silicon dioxide
Authors: Courtot-Descharles, A Paillet, P Leray, JL
Citation: A. Courtot-descharles et al., Theoretical study using density functional theory of defects in amorphous silicon dioxide, J NON-CRYST, 245, 1999, pp. 154-160
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