Authors:
Croci, S
Plossu, C
Balland, B
Dubois, C
Boivin, P
Citation: S. Croci et al., Effect of nitridation on Fowler-Nordheim tunneling coefficients in SiO2 MOS capacitors with WSi2-polysilicon gate, J MAT S-M E, 12(4-6), 2001, pp. 333-338
Authors:
Croci, S
Pecheur, A
Autran, JL
Vedda, A
Caccavale, F
Martini, M
Spinolo, G
Citation: S. Croci et al., SiO2 films deposited on silicon at low temperature by plasma-enhanced decomposition of hexamethyldisilazane: Defect characterization, J VAC SCI A, 19(5), 2001, pp. 2670-2675
Authors:
Astolfi, A
De Giovanni, C
Landuzzi, L
Nicoletti, G
Ricci, C
Croci, S
Scopece, L
Nanni, P
Lollini, PL
Citation: A. Astolfi et al., Identification of new genes related to the myogenic differentiation arrestof human rhabdomyosarcoma cells, GENE, 274(1-2), 2001, pp. 139-149
Authors:
Sorbier, JP
Plossu, C
Croci, S
Boivin, P
Renard, S
Harrabech, N
Bouchakour, R
Citation: Jp. Sorbier et al., Extraction of band diagram parameters from Fowler-Nordheim model in silicon dioxide, J NON-CRYST, 280(1-3), 2001, pp. 96-102
Authors:
Plossu, C
Croci, S
Monti, N
Bouchakour, R
Laffont, R
Boivin, P
Mirabel, JM
Citation: C. Plossu et al., Conduction properties of electrically erasable read only memory tunnel oxides under dynamic stress, J NON-CRYST, 280(1-3), 2001, pp. 103-109
Authors:
Croci, S
Plossu, C
Balland, B
Raynaud, C
Boivin, P
Citation: S. Croci et al., Effect of some technological parameters on Fowler-Nordheim injection through tunnel oxides for non-volatile memories, J NON-CRYST, 280(1-3), 2001, pp. 202-210
Authors:
Baccaro, S
Bohacek, P
Cecilia, A
Cemmi, A
Croci, S
Dafinei, I
Diemoz, M
Fabeni, P
Ishii, M
Kobayashi, M
Martini, M
Mihokova, E
Montecchi, M
Nikl, M
Organtini, G
Pazzi, GP
Usuki, Y
Vedda, A
Citation: S. Baccaro et al., Influence of Gd3+ concentration on PbWO4 : Gd3+ scintillation characteristics, PHYS ST S-A, 179(2), 2000, pp. 445-454
Authors:
Delamarre, D
Le Beux, P
Bedossa, M
LeBreton, H
Baskurt, A
Croci, S
Decaix, M
Pony, JC
Citation: D. Delamarre et al., CARDIOMEDIA: a communicable multimedia medical record on Intranet and digital optical memory card, INT J MED I, 55(3), 1999, pp. 211-222
Authors:
Croci, S
Voisin, JM
Plossu, C
Raynaud, C
Autran, JL
Boivin, P
Mirabel, JM
Citation: S. Croci et al., Extraction and evolution of Fowler-Nordheim tunneling parameters of thin gate oxides under EEPROM-like dynamic degradation, MICROEL REL, 39(6-7), 1999, pp. 879-884