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Results:
1-14
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Results: 14
Authors:
Miranda, P
Pajares, A
Guiberteau, F
Cumbrera, FL
Lawn, BR
Citation: P. Miranda et al., Role of flaw statistics in contact fracture of brittle coatings, ACT MATER, 49(18), 2001, pp. 3719-3726
Authors:
Ortiz, AL
Sanchez-Bajo, F
Padture, NP
Cumbrera, FL
Guiberteau, F
Citation: Al. Ortiz et al., Quantitative polytype-composition analyses of SiC using X-ray diffraction:a critical comparison between the polymorphic and the Rietveld methods, J EUR CERAM, 21(9), 2001, pp. 1237-1248
Authors:
Casellas, D
Cumbrera, FL
Sanchez-Bajo, F
Forsling, W
Llanes, L
Anglada, M
Citation: D. Casellas et al., On the transformation toughening of Y-ZrO2 ceramics with mixed Y-TZP/PSZ microstructures, J EUR CERAM, 21(6), 2001, pp. 765-777
Authors:
Miranda, P
Pajares, A
Guiberteau, F
Cumbrera, FL
Lawn, BR
Citation: P. Miranda et al., Contact fracture of brittle bilayer coatings on soft substrates, J MATER RES, 16(1), 2001, pp. 115-126
Authors:
Sanchez-Bajo, F
Ortiz, AL
Cumbrera, FL
Citation: F. Sanchez-bajo et al., Accuracy of X-ray diffraction SiC polytype-composition analyses performed by a polymorphic method, J MAT SCI L, 20(4), 2001, pp. 297-299
Authors:
Ortiz, AL
Sanchez-Bajo, F
Cumbrera, FL
Guiberteau, F
Citation: Al. Ortiz et al., X-ray powder diffraction analysis of a silicon carbide-based ceramic, MATER LETT, 49(2), 2001, pp. 137-145
Authors:
Xu, HW
Bhatia, T
Deshpande, SA
Padture, NP
Ortiz, AL
Cumbrera, FL
Citation: Hw. Xu et al., Microstructural evolution in liquid-phase-sintered SiC: Part I, effect of starting powder, J AM CERAM, 84(7), 2001, pp. 1578-1584
Authors:
Deshpande, SA
Bhatia, T
Xu, HW
Padture, NP
Ortiz, AL
Cumbrera, FL
Citation: Sa. Deshpande et al., Microstructural evolution in liquid-phase-sintered SiC: Part II, effects of planar defects and seeds in the starting powder, J AM CERAM, 84(7), 2001, pp. 1585-1590
Authors:
Ortiz, AL
Cumbrera, FL
Sanchez-Bajo, F
Guiberteau, F
Caruso, R
Citation: Al. Ortiz et al., Fundamental parameters approach in the Rietveld method: a study of the stability of results versus the accuracy of the instrumental profile, J EUR CERAM, 20(11), 2000, pp. 1845-1851
Authors:
Ortiz, AL
Cumbrera, FL
Sanchez-Bajo, F
Guiberteau, F
Xu, H
Padture, NP
Citation: Al. Ortiz et al., Quantitative analysis of liquid-phase-sintered SiC by using the Rietveld method, B S ESP CER, 39(3), 2000, pp. 347-350
Authors:
Sanchez-Bajo, F
Cumbrera, FL
Citation: F. Sanchez-bajo et Fl. Cumbrera, Deconvolution of X-ray diffraction profiles by using series expansion, J APPL CRYS, 33, 2000, pp. 259-266
Authors:
Ortiz, AL
Cumbrera, FL
Sanchez-Bajo, F
Guiberteau, F
Xu, HW
Padture, NP
Citation: Al. Ortiz et al., Quantitative phase-composition analysis of liquid-phase-sintered silicon carbide using the Rietveld method, J AM CERAM, 83(9), 2000, pp. 2282-2286
Authors:
Sanchez-Bajo, F
Cumbrera, FL
Citation: F. Sanchez-bajo et Fl. Cumbrera, A Gaussian-Hermite polynomials function for X-ray diffraction profile fitting, J APPL CRYS, 32, 1999, pp. 730-735
Authors:
Cumbrera, FL
Sanchez-Bajo, F
Fernandez, R
Llanes, L
Citation: Fl. Cumbrera et al., Microstructure effects in the X-ray powder diffraction profile of 9 mol% Mg-PSZ, J EUR CERAM, 18(14), 1998, pp. 2247-2252
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