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Authors: CUTOLO A DALIENTO S SANSEVERINO A VITALE GF ZENI L
Citation: A. Cutolo et al., AN OPTICAL TECHNIQUE TO MEASURE THE BULK LIFETIME AND THE SURFACE RECOMBINATION VELOCITY IN SILICON SAMPLES BASED ON A LASER-DIODE PROBE SYSTEM, Solid-state electronics, 42(6), 1998, pp. 1035-1038

Authors: DALIENTO S SANSEVERINO A SPIRITO P SARRO PM ZENI L
Citation: S. Daliento et al., RECOMBINATION CENTERS IDENTIFICATION IN VERY THIN SILICON EPITAXIAL LAYERS VIA LIFETIME MEASUREMENTS, IEEE electron device letters, 17(3), 1996, pp. 148-150

Authors: DALIENTO S RINALDI N SANSEVERINO A SPIRITO P
Citation: S. Daliento et al., 2-DIMENSIONAL ANALYSIS OF A TEST STRUCTURE FOR LIFETIME PROFILE MEASUREMENTS, I.E.E.E. transactions on electron devices, 42(11), 1995, pp. 1924-1928
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