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Results:
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Results: 18
Authors:
DANE AD
VELDHUIS A
DEBOER DKG
LEENAERS AJG
BUYDENS LMC
Citation: Ad. Dane et al., APPLICATION OF GENETIC ALGORITHMS FOR CHARACTERIZATION OF THIN-LAYERED MATERIALS BY GLANCING INCIDENCE X-RAY REFLECTOMETRY, Physica. B, Condensed matter, 253(3-4), 1998, pp. 254-268
Authors:
DEBOER DKG
LEENAERS AJG
VANDERWIELEN MWJ
STUART MAC
FLEER GJ
NIEUWHOF RP
MARCELIS ATM
SUDHOLTER EJR
Citation: Dkg. Deboer et al., SPECULAR AND NON-SPECULAR X-RAY REFLECTION FROM INORGANIC AND ORGANICMULTILAYERS, Physica. B, Condensed matter, 248, 1998, pp. 274-279
Authors:
VANDERWIELEN MWJ
STUART MAC
FLEER GJ
DEBOER DKG
LEENAERS AJG
NIEUWHOF RP
MARCELIS ATM
SUDHOLTER EJR
Citation: Mwj. Vanderwielen et al., ORDER IN THIN-FILMS OF SIDE-CHAIN LIQUID-CRYSTALLINE POLYMERS, Langmuir, 13(17), 1997, pp. 4762-4766
Authors:
DEBOER DKG
Citation: Dkg. Deboer, 6TH CONFERENCE ON TOTAL-REFLECTION X-RAY-FLUORESCENCE ANALYSIS AND RELATED METHODS - TXRF-96, EINDHOVEN AND DORTMUND - PREFACE, Spectrochimica acta, Part B: Atomic spectroscopy, 52(7), 1997, pp. 9-11
Authors:
LEENAERS AJG
VRAKKING JJAM
DEBOER DKG
Citation: Ajg. Leenaers et al., GLANCING INCIDENCE X-RAY-ANALYSIS - MORE THAN JUST REFLECTIVITY, Spectrochimica acta, Part B: Atomic spectroscopy, 52(7), 1997, pp. 805-812
Authors:
LEENAERS AJG
DEBOER DKG
Citation: Ajg. Leenaers et Dkg. Deboer, APPLICATIONS OF GLANCING INCIDENCE X-RAY-ANALYSIS, X-ray spectrometry, 26(3), 1997, pp. 115-121
Authors:
DEBOER DKG
LEENAERS AJG
Citation: Dkg. Deboer et Ajg. Leenaers, PROBING INTERFACE ROUGHNESS BY X-RAY-SCATTERING, Physica. B, Condensed matter, 221(1-4), 1996, pp. 18-26
Authors:
DEBOER DKG
KLOCKENKAEMPER R
Citation: Dkg. Deboer et R. Klockenkaemper, TOTAL-REFLECTION X-RAY-FLUORESCENCE ANALYSIS AND RELATED METHODS, TrAC. Trends in analytical chemistry, 15(9), 1996, pp. 7-7
Authors:
DEBOER DKG
Citation: Dkg. Deboer, X-RAY-SCATTERING AND X-RAY-FLUORESCENCE FROM MATERIALS WITH ROUGH INTERFACES, Physical review. B, Condensed matter, 53(10), 1996, pp. 6048-6064
Authors:
DEBOER DKG
Citation: Dkg. Deboer, X-RAY REFLECTION AND TRANSMISSION BY ROUGH SURFACES, Physical review. B, Condensed matter, 51(8), 1995, pp. 5297-5305
Authors:
DEBOER DKG
LEENAERS AJG
VANDENHOOGENHOF WW
Citation: Dkg. Deboer et al., GLANCING-INCIDENCE X-RAY-ANALYSIS OF THIN-LAYERED MATERIALS - A REVIEW, X-ray spectrometry, 24(3), 1995, pp. 91-102
Authors:
DEBOER DKG
LEENAERS AJG
WOLF RM
Citation: Dkg. Deboer et al., X-RAY REFLECTOMETRY FROM SAMPLES WITH ROUGH INTERFACES - AN OXIDIC-MULTILAYER STUDY, Journal of physics. D, Applied physics, 28(4A), 1995, pp. 227-230
Authors:
DEBOER DKG
LEENAERS AJG
VANDENHOOGENHOF WW
Citation: Dkg. Deboer et al., INFLUENCE OF ROUGHNESS PROFILE ON REFLECTIVITY AND ANGLE-DEPENDENT X-RAY-FLUORESCENCE, Journal de physique. III, 4(9), 1994, pp. 1559-1564
Authors:
DEBOER DKG
CHAUVINEAU JP
Citation: Dkg. Deboer et Jp. Chauvineau, NANOMETER-SCALE METHODS IN X-RAY TECHNOLOGY 11-13 OCTOBER 1993, KONINGSHOF, VELDHOVEN, THE NETHERLANDS - FOREWORD, Journal de physique. III, 4(9), 1994, pp. 180000005-180000005
Authors:
DEBOER DKG
LEENAERS AJG
VANDENHOOGENHOF WW
Citation: Dkg. Deboer et al., THE PROFILE OF LAYERED MATERIALS REFLECTED BY GLANCING-INCIDENCE X-RAY-ANALYSIS, Applied physics. A, Solids and surfaces, 58(3), 1994, pp. 169-172
Authors:
DEBOER DKG
Citation: Dkg. Deboer, INFLUENCE OF THE ROUGHNESS PROFILE ON THE SPECULAR REFLECTIVITY OF X-RAYS AND NEUTRONS, Physical review. B, Condensed matter, 49(9), 1994, pp. 5817-5820
Authors:
VANDERHOOGENHOF WW
DEBOER DKG
Citation: Ww. Vanderhoogenhof et Dkg. Deboer, GLANCING INCIDENCE X-RAY-ANALYSIS - FORGOTTEN OR TO BE DISCOVERED, Surface and interface analysis, 22(1-12), 1994, pp. 572-575
Authors:
VANDEWEIJER P
DEBOER DKG
Citation: P. Vandeweijer et Dkg. Deboer, ELEMENTAL ANALYSIS OF THIN-LAYERS BY X-RAYS, Philips journal of research, 47(3-5), 1993, pp. 247-262
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