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Results: 1-19 |
Results: 19

Authors: DELAET J SMETS E
Citation: J. Delaet et E. Smets, ON THE TTSC-FTSC FORMULATION OF STANDARD PARSIMONY, Cladistics (Print), 14(3), 1998, pp. 239-248

Authors: DECRAENE LPR DELAET J SMETS EF
Citation: Lpr. Decraene et al., FLORAL DEVELOPMENT AND ANATOMY OF MORINGA-OLEIFERA (MORINGACEAE) - WHAT IS THE EVIDENCE FOR A CAPPARALEAN OR SAPINDALEAN AFFINITY, Annals of botany (Print), 82(3), 1998, pp. 273-284

Authors: DELAET J TERRYN H VEREECKEN J
Citation: J. Delaet et al., DEVELOPMENT OF AN OPTICAL-MODEL FOR STEADY-STATE POROUS ANODIC FILMS ON ALUMINUM FORMED IN PHOSPHORIC-ACID, Thin solid films, 320(2), 1998, pp. 241-252

Authors: HEMMES K HAMSTRA MA KOOPS KR WIND MM SCHRAM T DELAET J BENDER H
Citation: K. Hemmes et al., EVALUATION OF INTERFEROMETRIC ELLIPSOMETER SYSTEMS WITH A TIME RESOLUTION OF ONE MICROSECOND AND FASTER, Thin solid films, 313, 1998, pp. 40-46

Authors: SCHRAM T DELAET J TERRYN H
Citation: T. Schram et al., NONDESTRUCTIVE OPTICAL CHARACTERIZATION OF CHROMIUM CONVERSION LAYERSON ALUMINUM, Thin solid films, 313, 1998, pp. 727-731

Authors: SCHRAM T DELAET J TERRYN H
Citation: T. Schram et al., NONDESTRUCTIVE OPTICAL CHARACTERIZATION OF CHEMICAL CONVERSION COATINGS ON ALUMINUM, Journal of the Electrochemical Society, 145(8), 1998, pp. 2733-2739

Authors: HABAZAKI H SKELDON P THOMPSON GE WAN J WOOD GC ZHOU X DELAET J SHIMIZU K
Citation: H. Habazaki et al., ANODIC-OXIDATION OF AL-CR ALLOYS AND THE VALENCE STATE OF CHROMIUM, Journal of the Electrochemical Society, 144(12), 1997, pp. 4217-4222

Authors: HABAZAKI H SKELDON P THOMPSON GE ZHOU X DELAET J WOOD GC
Citation: H. Habazaki et al., THE INCORPORATION AND MOBILITY OF CHROMIUM SPECIES IN ANODIC ALUMINA FILMS, Corrosion science, 39(4), 1997, pp. 719-730

Authors: MESZAROS S DELAET J SMETS E
Citation: S. Meszaros et al., PHYLOGENY OF TEMPERATE GENTIANACEAE - A MORPHOLOGICAL APPROACH, Systematic botany, 21(2), 1996, pp. 153-168

Authors: DELAET J TERRYN H VEREECKEN J
Citation: J. Delaet et al., THE USE OF IMPEDANCE SPECTROSCOPY AND OPTICAL REFLECTION SPECTROSCOPYTO STUDY MODIFIED ALUMINUM SURFACES, Electrochimica acta, 41(7-8), 1996, pp. 1155-1161

Authors: DECRAENE LPR DELAET J SMETS EF
Citation: Lpr. Decraene et al., MORPHOLOGICAL-STUDIES IN ZYGOPHYLLACEAE .2. THE FLORAL DEVELOPMENT AND VASCULAR ANATOMY OF PEGANUM-HARMALA, American journal of botany, 83(2), 1996, pp. 201-215

Authors: DELAET J CLINCKEMAILLIE D JANSEN S SMETS E
Citation: J. Delaet et al., FLORAL ONTOGENY IN THE PLUMBAGINACEAE, Journal of plant research, 108(1091), 1995, pp. 289-304

Authors: FARRIS JS KALLERSJO M ALBERT VA ALLARD M ANDERBERG A BOWDITCH B BULT C CARPENTER JM CROWE TM DELAET J FITZHUGH K FROST D GOLOBOFF P HUMPHRIES CJ JONDELIUS U JUDD D KARIS PO LIPSCOMB D LUCKOW M MINDELL D MUONA J NIXON K PRESCH W SEBERG O SIDDALL ME STRUWE L TEHLER A WENZEL J WHEELER Q WHEELER W
Citation: Js. Farris et al., EXPLANATION, Cladistics, 11(2), 1995, pp. 211-218

Authors: DELAET J SMETS E
Citation: J. Delaet et E. Smets, AN INTRODUCTION TO CLADISM, Belgian journal of botany, 127(2), 1994, pp. 207-229

Authors: DELAET J DEBOECIK K TERRYN H VEREECKEN J
Citation: J. Delaet et al., DETERMINATION OF THE DEPTH RESOLUTION OF AUGER-ELECTRON SPECTROSCOPY DEPTH PROFILES OF ANODIC BARRIER OXIDE-FILMS ON DIFFERENTLY PRETREATEDALUMINUM SUBSTRATES, Surface and interface analysis, 22(1-12), 1994, pp. 175-180

Authors: GOEMINNE G DELAET J TERRYN H VEREECKEN J
Citation: G. Goeminne et al., NONDESTRUCTIVE CHARACTERIZATION OF CHROMIUM PHOSPHATE COATED ALUMINUMWITH SE AND FTIRS CORRELATED TO SURFACE ANALYTICAL ANALYSES BY AES AND TEM, Surface and interface analysis, 22(1-12), 1994, pp. 445-450

Authors: DELAET J GOEMINNE G TERRYN H VEREECKEN J
Citation: J. Delaet et al., CHARACTERIZATION OF OXYDE FILMS AND CONVERSION LAYERS ON ALUMINUM-ALLOYS, Journal de physique. IV, 3(C7), 1993, pp. 981-985

Authors: DELAET J VANHELLEMONT J TERRYN H VEREECKEN J
Citation: J. Delaet et al., CHARACTERIZATION OF DIFFERENT CONVERSION COATINGS ON ALUMINUM WITH SPECTROSCOPIC ELLIPSOMETRY, Thin solid films, 233(1-2), 1993, pp. 58-62

Authors: DELAET J SCHEERS J TERRYN H VEREECKEN J
Citation: J. Delaet et al., CHARACTERIZATION OF ALUMINUM SURFACE TREATMENTS WITH ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY AND SPECTROSCOPIC ELLIPSOMETRY, Electrochimica acta, 38(14), 1993, pp. 2103-2109
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