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Results: 1-11 |
Results: 11
SCANNING FORCE MICROSCOPY INVESTIGATION OF ION-BOMBARDED INP
Authors: DEMANET CM
Citation: Cm. Demanet, SCANNING FORCE MICROSCOPY INVESTIGATION OF ION-BOMBARDED INP, Applied surface science, 135(1-4), 1998, pp. 53-58
USING SCANNING FORCE MICROSCOPY (SFM) TO INVESTIGATE VARIOUS CLEANINGPROCEDURES OF DIFFERENT TRANSPARENT CONDUCTING OXIDE SUBSTRATES
Authors: NEL JM DEMANET CM HILLIE KT AURET FD GAIGHER HL
Citation: Jm. Nel et al., USING SCANNING FORCE MICROSCOPY (SFM) TO INVESTIGATE VARIOUS CLEANINGPROCEDURES OF DIFFERENT TRANSPARENT CONDUCTING OXIDE SUBSTRATES, Applied surface science, 134(1-4), 1998, pp. 22-30
ATOMIC-FORCE MICROSCOPY STUDY OF SI(111) SURFACE-MORPHOLOGY AND ELECTRICAL CHARACTERISTICS OF PD N-SI SCHOTTKY DIODES - EFFECT OF CLEANING PROCEDURES/
Authors: DEENAPANRAY PNK AURET FD MYBURG G HILLIE KT DEMANET CM
Citation: Pnk. Deenapanray et al., ATOMIC-FORCE MICROSCOPY STUDY OF SI(111) SURFACE-MORPHOLOGY AND ELECTRICAL CHARACTERISTICS OF PD N-SI SCHOTTKY DIODES - EFFECT OF CLEANING PROCEDURES/, Surface and interface analysis, 26(10), 1998, pp. 748-757
APPLICATIONS OF ATOMIC-FORCE MICROSCOPY
Authors: DEMANET CM
Citation: Cm. Demanet, APPLICATIONS OF ATOMIC-FORCE MICROSCOPY, South African journal of science, 93(7), 1997, pp. 298-302
THE SURFACE-TOPOGRAPHY OF AN ION MILLED WC-CO SAMPLE
Authors: DEMANET CM LUYCKX S SHRIVASTAVA S WITCOMB M
Citation: Cm. Demanet et al., THE SURFACE-TOPOGRAPHY OF AN ION MILLED WC-CO SAMPLE, Journal of materials science letters, 15(5), 1996, pp. 425-427
ATOMIC-FORCE MICROSCOPY IMAGES OF A POLLEN GRAIN - A PRELIMINARY-STUDY
Authors: DEMANET CM SANKAR KV
Citation: Cm. Demanet et Kv. Sankar, ATOMIC-FORCE MICROSCOPY IMAGES OF A POLLEN GRAIN - A PRELIMINARY-STUDY, South African journal of botany, 62(4), 1996, pp. 221-223
ATOMIC-FORCE MICROSCOPY INVESTIGATION OF NOBLE-GAS ION-BOMBARDMENT ONINP - EFFECT OF ION ENERGY
Authors: DEMANET CM SANKAR KV MALHERBE JB VANDERBERG NG ODENDAAL RQ
Citation: Cm. Demanet et al., ATOMIC-FORCE MICROSCOPY INVESTIGATION OF NOBLE-GAS ION-BOMBARDMENT ONINP - EFFECT OF ION ENERGY, Surface and interface analysis, 24(8), 1996, pp. 497-502
ATOMIC-FORCE MICROSCOPY INVESTIGATION OF ION-BOMBARDED INP - EFFECT OF ANGLE OF ION-BOMBARDMENT
Authors: DEMANET CM SANKAR KV MALHERBE JB
Citation: Cm. Demanet et al., ATOMIC-FORCE MICROSCOPY INVESTIGATION OF ION-BOMBARDED INP - EFFECT OF ANGLE OF ION-BOMBARDMENT, Surface and interface analysis, 24(8), 1996, pp. 503-510
ATOMIC-FORCE MICROSCOPY DETERMINATION OF THE TOPOGRAPHY OF FLY-ASH PARTICLES
Authors: DEMANET CM
Citation: Cm. Demanet, ATOMIC-FORCE MICROSCOPY DETERMINATION OF THE TOPOGRAPHY OF FLY-ASH PARTICLES, Applied surface science, 89(1), 1995, pp. 97-101
ATOMIC-FORCE MICROSCOPY INVESTIGATION OF ARGON-BOMBARDED INP - EFFECTOF ION DOSE DENSITY
Authors: DEMANET CM MALHERBE JB VANDERBERG NG SANKAR V
Citation: Cm. Demanet et al., ATOMIC-FORCE MICROSCOPY INVESTIGATION OF ARGON-BOMBARDED INP - EFFECTOF ION DOSE DENSITY, Surface and interface analysis, 23(7-8), 1995, pp. 433-439
SCANNING FORCE MICROSCOPY ANALYSIS OF THE SURFACE OF ION-IRRADIATED DIAMOND
Authors: DEMANET CM SHRIVASTAVA S SELLSCHOP JPF
Citation: Cm. Demanet et al., SCANNING FORCE MICROSCOPY ANALYSIS OF THE SURFACE OF ION-IRRADIATED DIAMOND, Surface and interface analysis, 23(2), 1995, pp. 115-119
Risultati: 1-11 |