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Citation: U. Breuer et al., COMPARATIVE-STUDIES OF SIMS AND SNMS ANALYSES DURING THE BUILD UP OF SPUTTER EQUILIBRIUM UNDER OXYGEN AND RARE-GAS ION-BOMBARDMENT, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 47-50
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Citation: Ai. Saprykin et al., DEPTH PROFILING ANALYSIS OF THICK NI-DOPED AND CO-DOPED OXIDE LAYERS ON CR-BASED ALLOYS OF THE INTERCONNECTOR OF A SOLID OXIDE FUEL-CELL USING RF-GDMS, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 145-147
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Citation: R. Jager et al., APPLICATION OF RF GDMS FOR TRACE-ELEMENT ANALYSIS OF NONCONDUCTING LA0.65SR0.3MNO3 CERAMIC LAYERS, Fresenius' journal of analytical chemistry, 358(1-2), 1997, pp. 214-217
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Citation: Js. Becker et Hj. Dietze, DOUBLE-FOCUSING SECTOR FIELD INDUCTIVELY-COUPLED PLASMA-MASS SPECTROMETRY FOR HIGHLY SENSITIVE MULTIELEMENT AND ISOTOPIC ANALYSIS - INVITEDLECTURE, Journal of analytical atomic spectrometry, 12(9), 1997, pp. 881-889
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Citation: R. Jager et al., INVESTIGATIONS ON THE ION ENERGY-DISTRIBUTION IN AN ANALYTICAL RADIOFREQUENCY GLOW-DISCHARGE AND ITS MASS-SPECTROMETRIC APPLICATION, International journal of mass spectrometry and ion processes, 171(1-3), 1997, pp. 183-189
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JAGER R
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Citation: R. Jager et al., ANALYSIS OF SEMICONDUCTING MATERIALS BY HIGH-RESOLUTION RADIOFREQUENCY GLOW-DISCHARGE MASS-SPECTROMETRY, Mikrochimica acta, 125(1-4), 1997, pp. 41-44
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Citation: Js. Becker et al., TRACE AND SURFACE-ANALYSIS OF CERAMIC LAYERS OF SOLID OXIDE FUEL-CELLS BY MASS-SPECTROMETRY, Fresenius' journal of analytical chemistry, 355(5-6), 1996, pp. 626-632
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BECKER JS
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Citation: Js. Becker et al., MASS-SPECTROMETRIC AND THEORETICAL INVESTIGATIONS INTO THE FORMATION OF ARGON MOLECULAR-IONS IN PLASMA-MASS SPECTROMETRY, Journal of analytical atomic spectrometry, 11(9), 1996, pp. 643-648
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BECKER JS
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Citation: Jt. Westheide et al., ANALYSIS OF CERAMIC LAYERS FOR SOLID OXIDE FUEL-CELLS BY LASER-ABLATION INDUCTIVELY-COUPLED PLASMA-MASS SPECTROSCOPY, Journal of analytical atomic spectrometry, 11(9), 1996, pp. 661-666
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