Authors:
DORMANS GJM
LARSEN PK
SPIERINGS GACM
DIKKEN J
ULENAERS MJE
CUPPENS R
TAYLOR DJ
VERHAAR RDJ
Citation: Gjm. Dormans et al., PROCESSING AND PERFORMANCE OF INTEGRATED FERROELECTRIC AND CMOS TEST STRUCTURES FOR MEMORY APPLICATIONS, Integrated ferroelectrics, 6(1-4), 1995, pp. 93-109