Authors: STOJADINOVIC N GOLUBOVIC S DJORIC S DIMITRIJEV S

Citation: N. Stojadinovic et al., ANALYSIS OF GAMMA-IRRADIATION INDUCED DEGRADATION MECHANISMS IN POWERVDMOSFETS, Microelectronics and reliability, 35(3), 1995, pp. 587-602

Authors: STOJADINOVIC N DJORIC S GOLUBOVIC S DAVIDOVIC V

Citation: N. Stojadinovic et al., SEPARATION OF IRRADIATION-INDUCED GATE OXIDE CHARGE AND INTERFACE D-TRAPS EFFECTS IN POWER VD-MOSFETS, Electronics Letters, 30(23), 1994, pp. 1992-1993