Citation: K. Dmowski et al., SMALL MAMMAL POPULATIONS AND COMMUNITY UNDER CONDITIONS OF EXTREMELY HIGH THALLIUM CONTAMINATION IN THE ENVIRONMENT, Ecotoxicology and environmental safety, 41(1), 1998, pp. 2-7
Citation: K. Dmowski et A. Halimaoui, THE INFLUENCE OF QUANTUM EFFECTS ON THE DETERMINATION OF GATE OXIDE THICKNESS FROM C-V MEASUREMENTS, Journal of non-crystalline solids, 216, 1997, pp. 185-191
Citation: K. Dmowski et al., A MODIFIED METHOD OF SIDE DATA-ANALYSIS OF DEEP-LEVEL TRANSIENT SPECTROSCOPY SPECTRA, Journal of applied physics, 79(3), 1996, pp. 1468-1475
Citation: K. Dmowski et al., PEAK AND SIDE DATA ANALYSES TO MEASURE DEEP LEVELS BY DLS-82E LOCK-INSPECTROMETER, Materials science & engineering. B, Solid-state materials for advanced technology, 32(1-2), 1995, pp. 51-55
Citation: K. Dmowski, SIDE DATA-ANALYSIS OF DEEP-LEVEL TRANSIENT SPECTROSCOPY SPECTRA FOR AMULTIPOINT CORRELATION METHOD WITH BINOMIAL WEIGHTING COEFFICIENTS, Solid-state electronics, 38(5), 1995, pp. 1051-1057
Authors:
DMOWSKI K
VUILLAUME D
LEPLEY B
LOSSON E
BATH A
Citation: K. Dmowski et al., INTERFACE STATE MEASUREMENTS BY THE DLS-82E LOCK-IN SPECTROMETER, Review of scientific instruments, 66(8), 1995, pp. 4283-4288
Citation: J. Golimowski et K. Dmowski, VOLTAMMETRIC DETERMINATION OF MERCURY IN BIRD FEATHERS FOR BIOMONITORING STUDIES, Chemia Analityczna, 40(1), 1995, pp. 13-19
Citation: K. Dmowski et A. Jakubowski, IDENTIFICATION OF TUNNELING EMISSION IN SI-SIO2 INTERFACES BY MULTIPOINT CORRELATION METHOD WITH BINOMIAL WEIGHTING COEFFICIENTS, Journal of applied physics, 76(1), 1994, pp. 352-358
Authors:
DMOWSKI K
LEPLEY B
LOSSON E
ELBOUABDELLATI M
Citation: K. Dmowski et al., A METHOD TO CORRECT FOR LEAKAGE CURRENT EFFECTS IN DEEP-LEVEL TRANSIENT SPECTROSCOPY MEASUREMENTS ON SCHOTTKY DIODES, (VOL 74, PG 3936, 1993), Journal of applied physics, 75(6), 1994, pp. 3226-3226
Citation: K. Dmowski et J. Golimowski, FEATHERS OF THE MAGPIE (PICA-PICA) AS A BIOINDICATOR MATERIAL FOR HEAVY-METAL POLLUTION ASSESSMENT, Science of the total environment, 140, 1993, pp. 251-258
Citation: K. Dmowski et al., A NUMERICAL PROCEDURE TO DETERMINE NEAR MIDGAP LEVEL DEFECT PARAMETERS IN SCHOTTKY DIODES WITH SIGNIFICANT LEAKAGE CURRENT DENSITIES, Review of scientific instruments, 64(9), 1993, pp. 2655-2660
Authors:
DMOWSKI K
LEPLEY B
LOSSON E
ELBOUABDELLATI M
Citation: K. Dmowski et al., A METHOD TO CORRECT FOR LEAKAGE CURRENT EFFECTS IN DEEP-LEVEL TRANSIENT SPECTROSCOPY MEASUREMENTS ON SCHOTTKY DIODES, Journal of applied physics, 74(6), 1993, pp. 3936-3943