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Results: 8

Authors: SCHINDLER D BAUMER A BERNTHALER U SENNEFELDER H BROHM M WEBER BHF SANDOVAL N PLATZER M ROSENTHAL A SHILOH Y WEGNER RD SPERLING K DOERK T BENDIX R SKAWRAN B STUHRMANNSPANGENBERG M
Citation: D. Schindler et al., MUTATION ANALYSIS IN THE ATM GENE OF 67 ATAXIA-TELANGIECTASIA (A-T) PATIENTS IN GERMANY, European journal of human genetics, 6, 1998, pp. 4237-4237

Authors: DAMBACH S BACKE H DOERK T EFTEKHARI N EUTENEUER H GORGEN F HAGENBUCK F KAISER KH KETTIG O KUBE G LAUTH W SCHOPE H STEINHOF A TONN T WALCHER T
Citation: S. Dambach et al., NOVEL INTERFEROMETER IN THE SOFT-X-RAY REGION, Physical review letters, 80(25), 1998, pp. 5473-5476

Authors: POTT A DOERK T UHLENBUSCH J EHLBECK J HOSCHELE J STEINWANDEL J
Citation: A. Pott et al., POLARIZATION-SENSITIVE COHERENT ANTI-STOKES-RAMAN SCATTERING APPLIED TO THE DETECTION OF NO IN A MICROWAVE-DISCHARGE FOR REDUCTION OF NO, Journal of physics. D, Applied physics (Print), 31(19), 1998, pp. 2485-2498

Authors: DOERK T HERTL M PFELZER B HADRICH S JAUERNIK P UHLENBUSCH J
Citation: T. Doerk et al., RESONANCE-ENHANCED COHERENT ANTI-STOKES-RAMAN SCATTERING AND LASER-INDUCED FLUORESCENCE APPLIED TO CH RADICALS - A COMPARATIVE-STUDY, Applied physics. B, Lasers and optics, 64(1), 1997, pp. 111-118

Authors: DOERK T EHLBECK J JEDAMZIK R UHLENBUSCH J HOSCHELE J STEINWANDEL J
Citation: T. Doerk et al., APPLICATION OF COHERENT ANTI-STOKES-RAMAN SCATTERING (CARS) TECHNIQUETO THE DETECTION OF NO, Applied spectroscopy, 51(9), 1997, pp. 1360-1368

Authors: HADRICH S HEFTER S PFELZER B DOERK T JAUERNIK P UHLENBUSCH J
Citation: S. Hadrich et al., DETERMINATION OF THE ABSOLUTE RAMAN CROSS-SECTION OF METHYL, Chemical physics letters, 256(1-2), 1996, pp. 83-86

Authors: DOERK T JAUERNIK P HADRICH S PFELZER B UHLENBUSCH J
Citation: T. Doerk et al., RESONANCE-ENHANCED CARS APPLIED TO THE CH RADICAL, Optics communications, 118(5-6), 1995, pp. 637-647

Authors: HADRICH S PFELZER B DOERK T JAUERNIK P UHLENBUSCH J
Citation: S. Hadrich et al., TEMPERATURE AND CONCENTRATION PROFILES IN A LOW-PRESSURE METHANE PROCESS PLASMA, Journal of applied physics, 78(2), 1995, pp. 1297-1302
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