Authors: GAMBINO JP COLGAN EG DOMENICUCCI AG CUNNINGHAM B

Citation: Jp. Gambino et al., THE THERMAL-STABILITY OF COSI2 ON POLYCRYSTALLINE SILICON - THE EFFECT OF SILICON GRAIN-SIZE AND METAL THICKNESS, Journal of the Electrochemical Society, 145(4), 1998, pp. 1384-1389

Authors: DOMENICUCCI AG FILIPPI RG CHOI KW HU CK RODBELL KP

Citation: Ag. Domenicucci et al., EFFECT OF COPPER ON THE MICROSTRUCTURE AND ELECTROMIGRATION LIFETIME OF TI-ALCU-TI FINE LINES IN THE PRESENCE OF TUNGSTEN DIFFUSION-BARRIERS, Journal of applied physics, 80(9), 1996, pp. 4952-4959