Authors: VARICHENKO VS ZAITSEV AM LINDNER JKN DOMRES R PENINA NM ERCHAK DP CHELYADINSKII AR MARTINOVITSH VA

Citation: Vs. Varichenko et al., EPR, XRD AND OPTICAL REFLECTIVITY STUDIES OF RADIATION-DAMAGE IN SILICON AFTER HIGH-ENERGY IMPLANTATION OF NI IONS, Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 94(3), 1994, pp. 240-244