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Results: 2
ELECTRON-PARAMAGNETIC-RESONANCE STUDY OF SILVER-INDUCED DEFECTS IN SILICON
Authors:
HAI PN GREGORKIEWICZ T AMMERLAAN CAJ DON DT
Citation:
Pn. Hai et al., ELECTRON-PARAMAGNETIC-RESONANCE STUDY OF SILVER-INDUCED DEFECTS IN SILICON, Physical review. B, Condensed matter, 56(8), 1997, pp. 4614-4619
COPPER-RELATED DEFECTS IN SILICON - ELECTRON-PARAMAGNETIC-RESONANCE IDENTIFICATION
Authors:
HAI PN GREGORKIEWICZ T AMMERLAAN CAJ DON DT
Citation:
Pn. Hai et al., COPPER-RELATED DEFECTS IN SILICON - ELECTRON-PARAMAGNETIC-RESONANCE IDENTIFICATION, Physical review. B, Condensed matter, 56(8), 1997, pp. 4620-4625
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