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Results: 1-10 |
Results: 10
SUBPICOSECOND IMAGING-SYSTEM BASED ON ELECTROOPTIC EFFECT
Authors: JACOBSPERKINS D CURRIE M WANG CC WILLIAMS CA DONALDSON WR SOBOLEWSKI R HSIANG TY
Citation: D. Jacobsperkins et al., SUBPICOSECOND IMAGING-SYSTEM BASED ON ELECTROOPTIC EFFECT, IEEE journal of selected topics in quantum electronics, 2(3), 1996, pp. 729-738
DIRECT-DRIVE LASER-FUSION EXPERIMENTS WITH THE OMEGA, 60-BEAM, GREATER-THAN-40 KJ, ULTRAVIOLET-LASER SYSTEM
Authors: SOURES JM MCCRORY RL VERDON CP BABUSHKIN A BAHR RE BOEHLY TR BONI R BRADLEY DK BROWN DL CRAXTON RS DELETTREZ JA DONALDSON WR EPSTEIN R JAANIMAGI PA JACOBS SD KEARNEY K KECK RL KELLY JH KESSLER TJ KREMENS RL KNAUER JP KUMPAN SA LETZRING SA LONOBILE DJ LOUCKS SJ LUND LD MARSHALL FJ MCKENTY PW MEYERHOFER DD MORSE SFB OKISHEV A PAPERNOV S PIEN G SEKA W SHORT R SHOUP MJ SKELDON M SKUPSKY S SCHMID AW SMITH DJ SWALES S WITTMAN M YAAKOBI B
Citation: Jm. Soures et al., DIRECT-DRIVE LASER-FUSION EXPERIMENTS WITH THE OMEGA, 60-BEAM, GREATER-THAN-40 KJ, ULTRAVIOLET-LASER SYSTEM, Physics of plasmas, 3(5), 1996, pp. 2108-2112
THE ROLE OF THE LABORATORY FOR LASER ENERGETICS IN THE NATIONAL-IGNITION-FACILITY PROJECT
Authors: SOURES JM LOUCKS SJ MCCRORY RL VERDON CP BABUSHKIN A BAHR RE BOEHLY TR BONI R BRADLEY DK BROWN DL DELETTREZ JA CRAXTON RS DONALDSON WR EPSTEIN R GRAM R HARDING DR JAANIMAGI PA JACOBS SD KEARNEY K KECK RL KELLY JH KESSLER TJ KREMENS RL KNAUER JP LETZRING SA LONOBILE DJ LUND LD MARSHALL FJ MCKENTY PW MEYERHOFER DD MORSE SFB OKISHEV A PAPERNOV S PIEN G SEKA W SHORT RW SHOUP MJ SKELDON MD SKUPSKY S SCHMID AQ SMITH DJ SWALES S WITTMAN M YAAKOBI B
Citation: Jm. Soures et al., THE ROLE OF THE LABORATORY FOR LASER ENERGETICS IN THE NATIONAL-IGNITION-FACILITY PROJECT, Fusion technology, 30(3), 1996, pp. 492-496
THE USE OF A GENERIC, PATIENT-BASED HEALTH ASSESSMENT (SF-36) FOR EVALUATION OF PATIENTS WITH ANTERIOR CRUCIATE LIGAMENT INJURIES
Authors: SHAPIRO ET RICHMOND JC ROCKETT SE MCGRATH MM DONALDSON WR
Citation: Et. Shapiro et al., THE USE OF A GENERIC, PATIENT-BASED HEALTH ASSESSMENT (SF-36) FOR EVALUATION OF PATIENTS WITH ANTERIOR CRUCIATE LIGAMENT INJURIES, American journal of sports medicine, 24(2), 1996, pp. 196-200
TRANSIENT FLUX DYNAMICS IN OPTICALLY IRRADIATED YBCO THIN-FILM SWITCHES
Authors: GUPTA D DONALDSON WR KADIN AM
Citation: D. Gupta et al., TRANSIENT FLUX DYNAMICS IN OPTICALLY IRRADIATED YBCO THIN-FILM SWITCHES, IEEE transactions on applied superconductivity, 5(2), 1995, pp. 1371-1374
RAPID FLUX MOTION AND CRITICAL-STATE DYNAMICS IN A SUPERCONDUCTING DISK
Authors: GUPTA D DONALDSON WR KADIN AM
Citation: D. Gupta et al., RAPID FLUX MOTION AND CRITICAL-STATE DYNAMICS IN A SUPERCONDUCTING DISK, Journal of applied physics, 78(1), 1995, pp. 372-379
USE OF THE SUTURE ANCHOR IN OPEN BANKART RECONSTRUCTION - A FOLLOW-UPREPORT
Authors: LEVINE WN RICHMOND JC DONALDSON WR
Citation: Wn. Levine et al., USE OF THE SUTURE ANCHOR IN OPEN BANKART RECONSTRUCTION - A FOLLOW-UPREPORT, American journal of sports medicine, 22(5), 1994, pp. 723-726
EFFECT OF ILLUMINATION UNIFORMITY ON GAAS PHOTOCONDUCTIVE SWITCHES
Authors: DONALDSON WR MU LY
Citation: Wr. Donaldson et Ly. Mu, EFFECT OF ILLUMINATION UNIFORMITY ON GAAS PHOTOCONDUCTIVE SWITCHES, IEEE journal of quantum electronics, 30(12), 1994, pp. 2866-2874
PICOSECOND ELECTRICAL CHARACTERIZATION OF X-RAY MICROCHANNEL-PLATE DETECTORS USED IN DIAGNOSING INERTIAL CONFINEMENT FUSION EXPERIMENTS
Authors: DENYSENKO A ALEXANDROU S WANG CC BRADLEY DK DONALDSON WR HSIANG TY SOBOLEWSKI R BELL PM
Citation: A. Denysenko et al., PICOSECOND ELECTRICAL CHARACTERIZATION OF X-RAY MICROCHANNEL-PLATE DETECTORS USED IN DIAGNOSING INERTIAL CONFINEMENT FUSION EXPERIMENTS, Review of scientific instruments, 64(11), 1993, pp. 3285-3288
NUMERICAL-ANALYSIS OF ELECTRIC-FIELD PROFILES IN HIGH-VOLTAGE GAAS PHOTOCONDUCTIVE SWITCHES AND COMPARISON TO EXPERIMENT
Authors: KINGSLEY LE DONALDSON WR
Citation: Le. Kingsley et Wr. Donaldson, NUMERICAL-ANALYSIS OF ELECTRIC-FIELD PROFILES IN HIGH-VOLTAGE GAAS PHOTOCONDUCTIVE SWITCHES AND COMPARISON TO EXPERIMENT, I.E.E.E. transactions on electron devices, 40(12), 1993, pp. 2344-2351
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