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Results:
1-8
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Results: 8
Authors:
OSTERLE W
DORFEL I
URBAN I
REIER T
SCHULTZE JW
Citation: W. Osterle et al., XPS AND XTEM STUDY OF A1N FORMATION BY N-2(+) IMPLANTATION OF ALUMINUM, Surface & coatings technology, 102(1-2), 1998, pp. 168-174
Authors:
WOYDT M
SKOPP A
DORFEL I
WITKE K
Citation: M. Woydt et al., WEAR ENGINEERING OXIDES ANTI-WEAR OXIDES, Wear, 218(1), 1998, pp. 84-95
Authors:
SIEBER I
WANDERKA N
URBAN I
DORFEL I
SCHIERHORN E
FENSKE F
FUHS W
Citation: I. Sieber et al., ELECTRON-MICROSCOPIC CHARACTERIZATION OF REACTIVELY SPUTTERED ZNO FILMS WITH DIFFERENT AL-DOPING LEVELS, Thin solid films, 330(2), 1998, pp. 108-113
Authors:
DORFEL I
URBAN I
OSTERLE W
SCHIERBORN E
Citation: I. Dorfel et al., TEM STUDIES OF ION-IMPLANTED ALN LAYERS, European journal of cell biology, 74, 1997, pp. 117-117
Authors:
SIEBER I
WANDERKA N
DIESNER K
URBAN I
DORFEL I
Citation: I. Sieber et al., ELECTRON-MICROSCOPIC CHARACTERIZATION OF REACTIVELY SPUTTERED ZNO FILMS WITH DIFFERENT AL-DOPING, European journal of cell biology, 74, 1997, pp. 120-120
Authors:
DORFEL I
URBAN I
Citation: I. Dorfel et I. Urban, TRANSMISSION ELECTRON-MICROSCOPY OF BOUND ARY ZONE DAMAGE TO ALUMINUM-OXIDE CERAMICS FOLLOWING POLISHING, Materialwissenschaft und Werkstofftechnik, 27(6), 1996, pp. 307-312
Authors:
SIEBER I
URBAN I
DORFEL I
KOYNOV S
SCHWARZ R
SCHMIDT M
Citation: I. Sieber et al., MICROSCOPIC CHARACTERIZATION OF MICROCRYSTALLINE SILICON THIN-FILMS, Thin solid films, 276(1-2), 1996, pp. 314-317
Authors:
RESSEL P
OSTERLE W
URBAN I
DORFEL I
KLEIN A
VOGEL K
KRAUTLE H
Citation: P. Ressel et al., TRANSMISSION ELECTRON-MICROSCOPY STUDY OF RAPID THERMALLY ANNEALED PDGE CONTACTS ON IN0.53GA0.47AS/, Journal of applied physics, 80(7), 1996, pp. 3910-3914
Risultati:
1-8
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