Authors: DREIBELBIS J

Citation: J. Dreibelbis, INTRODUCTION TO THE MEMORY SECTION, IEEE journal of solid-state circuits, 33(11), 1998, pp. 1649-1649

Authors: DREIBELBIS J BARTH J KALTER H KHO R

Citation: J. Dreibelbis et al., PROCESSOR-BASED BUILT-IN SELF-TEST FOR EMBEDDED DRAM, IEEE journal of solid-state circuits, 33(11), 1998, pp. 1731-1740