Authors:
GOPI PK
LI GP
SONEK GJ
DUNKLEY J
HANNAMAN D
PATTERSON J
WILLARD S
Citation: Pk. Gopi et al., NEW DEGRADATION MECHANISM ASSOCIATED WITH HYDROGEN IN BIPOLAR-TRANSISTORS UNDER HOT-CARRIER STRESS, Applied physics letters, 63(9), 1993, pp. 1237-1239