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Results:
1-8
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Results: 8
Authors:
DURKAN C
SHVETS IV
Citation: C. Durkan et Iv. Shvets, POLARIZATION EFFECTS IN REFLECTION-MODE SCANNING NEAR-FIELD OPTICAL MICROSCOPY, Journal of applied physics, 83(4), 1998, pp. 1837-1843
Authors:
DURKAN C
SHVETS IV
Citation: C. Durkan et Iv. Shvets, REFLECTION-MODE SCANNING NEAR-FIELD OPTICAL MICROSCOPY - INFLUENCE OFSAMPLE TYPE, TIP SHAPE, AND POLARIZATION OF LIGHT, Journal of applied physics, 83(3), 1998, pp. 1171-1176
Authors:
DURKAN C
LODDER C
SHVETS IV
Citation: C. Durkan et al., KERR-EFFECT BASED MAGNETOOPTIC IMAGING WITH SUB-100 NM RESOLUTION, Journal of applied physics, 81(8), 1997, pp. 5019-5019
Authors:
DURKAN C
SHVETS IV
LODDER JC
Citation: C. Durkan et al., OBSERVATION OF MAGNETIC DOMAINS USING A REFLECTION-MODE SCANNING NEAR-FIELD OPTICAL MICROSCOPE, Applied physics letters, 70(10), 1997, pp. 1323-1325
Authors:
DURKAN C
SHVETS IV
Citation: C. Durkan et Iv. Shvets, METHOD FOR INCREASING SHEAR-FORCE DETECTION SENSITIVITY WITH UNCOATEDFIBER TIPS, Applied optics, 36(31), 1997, pp. 8173-8178
Authors:
DURKAN C
SHVETS IV
Citation: C. Durkan et Iv. Shvets, INVESTIGATION OF THE PHYSICAL-MECHANISMS OF SHEAR-FORCE IMAGING, Journal of applied physics, 80(10), 1996, pp. 5659-5664
Authors:
DURKAN C
SHVETS IV
Citation: C. Durkan et Iv. Shvets, STUDY OF SHEAR FORCE AS A DISTANCE REGULATION MECHANISM FOR SCANNING NEAR-FIELD OPTICAL MICROSCOPY, Journal of applied physics, 79(3), 1996, pp. 1219-1223
Authors:
DURKAN C
SHVETS IV
Citation: C. Durkan et Iv. Shvets, 40NM RESOLUTION IN REFLECTION-MODE SNOM WITH LAMBDA=685 NM, Ultramicroscopy, 61(1-4), 1995, pp. 227-231
Risultati:
1-8
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