40NM RESOLUTION IN REFLECTION-MODE SNOM WITH LAMBDA=685 NM

Authors
DURKAN C SHVETS IV
Citation
C. Durkan et Iv. Shvets, 40NM RESOLUTION IN REFLECTION-MODE SNOM WITH LAMBDA=685 NM, Ultramicroscopy, 61(1-4), 1995, pp. 227-231
Citations number
5
Categorie Soggetti
Microscopy
Journal title
Ultramicroscopy → ACNP
ISSN journal
03043991
Volume
61
Issue
1-4
Year of publication
1995
Pages
227 - 231
Database
ISI
SICI code
0304-3991(1995)61:1-4<227:4RIRSW>2.0.ZU;2-9
Abstract
A reflection-mode aperture SNOM based on external collection of the re flected light is presented. The Light detection is based on an ellipti cal mirror set-up, with the tip at one focus, and a PMT at the other. Tapered metal-coated fibres are used as SNOM probes, with a wavelength of 685 nm. Shear-force distance regulation is used. Images of a cross grating structure indicate a shear-force resolution of 20-30 nm, and an optical resolution of 40-50 nm (lambda/15).