Authors: Marchi, F Tonneau, D Dallaporta, H Safarov, V Bouchiat, V Doppelt, P Even, R Beitone, L

Citation: F. Marchi et al., Direct patterning of noble metal nanostructures with a scanning tunneling microscope, J VAC SCI B, 18(3), 2000, pp. 1171-1176

Authors: Szkutnik, PD Piednoir, A Ronda, A Marchi, F Tonneau, D Dallaporta, H Hanbucken, M

Citation: Pd. Szkutnik et al., STM studies: spatial resolution limits to fit observations in nanotechnology, APPL SURF S, 164, 2000, pp. 169-174

Authors: Bernardini, J Dallaporta, H Le Lay, G Soukiassian, P

Citation: J. Bernardini et al., ACSIN-5 - Proceedings of the Fifth International Symposium on Atomically Controlled Surfaces, Interfaces and Nanostructures - Aix en Provence, France, July 6-9, 1999 - Preface, APPL SURF S, 162, 2000, pp. XIII-XIII

Authors: Marchi, F Tonneau, D Dallaporta, H Pierrisnard, R Bouchiat, V Safarov, VI Doppelt, P Even, R

Citation: F. Marchi et al., Nanometer scale patterning by scanning tunelling microscope assisted chemical vapour deposition, MICROEL ENG, 50(1-4), 2000, pp. 59-65

Authors: Marchi, F Tonneau, D Pierrisnard, R Bouchiat, V Safarov, V Dallaporta, H Doppelt, P Even, R

Citation: F. Marchi et al., Deposition of nanoscale rhodium dots by STM assisted CVD, J PHYS IV, 9(P8), 1999, pp. 733-739

Authors: Marchi, F Bouchiat, V Dallaporta, H Safarov, V Tonneau, D Doppelt, P

Citation: F. Marchi et al., Growth of silicon oxide on hydrogenated silicon during lithography with anatomic force microscope, J VAC SCI B, 16(6), 1998, pp. 2952-2956