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Results: 26-50/71
Authors:
Hegeman, JBJW
De Hosson, JTM
de With, G
Citation: Jbjw. Hegeman et al., Grinding of WC-Co hardmetals, WEAR, 248(1-2), 2001, pp. 187-196
Authors:
Palasantzas, G
Barnas, J
De Hosson, JTM
Citation: G. Palasantzas et al., Non-conformal interface roughness effects on the giant magnetoresistance in magnetic multilayers, SURF SCI, 482, 2001, pp. 1026-1029
Authors:
van Agterveld, DTL
Koch, SA
Palasantzas, G
De Hosson, JTM
Citation: Dtl. Van Agterveld et al., Ultra high vacuum scanning Auger/electron microscopy studies of oxidation and B surface segregation of in situ fractured B-doped Ni3Al alloys, SURF SCI, 482, 2001, pp. 254-259
Authors:
Koch, SA
van Agterveld, DTL
Palasantzas, G
De Hosson, JTM
Citation: Sa. Koch et al., Electron beam induced oxidation of surfaces of Ni3Al-base alloys, SURF SCI, 476(3), 2001, pp. L267-L272
Authors:
Palasantzas, G
De Hosson, JTM
Citation: G. Palasantzas et Jtm. De Hosson, The effect of mound roughness on the electrical capacitance of a thin insulating film, SOL ST COMM, 118(4), 2001, pp. 203-206
Authors:
Ocelik, V
Vreeling, JA
De Hosson, JTM
Citation: V. Ocelik et al., EBSP study of reaction zone in SiC/Al metal matrix composite prepared by laser melt injection, J MATER SCI, 36(20), 2001, pp. 4845-4849
Authors:
Vrenken, H
Kooi, BJ
De Hosson, JTM
Citation: H. Vrenken et al., Microstructure and properties of giant magnetoresistive granular Au80Co20 alloys, J APPL PHYS, 89(6), 2001, pp. 3381-3387
Authors:
Zhao, YP
Gamache, RM
Wang, GC
Lu, TM
Palasantzas, G
De Hosson, JTM
Citation: Yp. Zhao et al., Effect of surface roughness on magnetic domain wall thickness, domain size, and coercivity, J APPL PHYS, 89(2), 2001, pp. 1325-1330
Authors:
Palasantzas, G
Barnas, J
De Hosson, JTM
Citation: G. Palasantzas et al., Correlated roughness effects on electrical conductivity of quantum wires, J APPL PHYS, 89(12), 2001, pp. 8002-8005
Authors:
Palasantzas, G
De Hosson, JTM
Citation: G. Palasantzas et Jtm. De Hosson, Mound surface roughness effects on the thermal capacitance of thin films, J APPL PHYS, 89(11), 2001, pp. 6130-6134
Authors:
Tsamouras, D
Palasantzas, G
De Hosson, JTM
Citation: D. Tsamouras et al., Growth front roughening of room-temperature deposited oligomer films, APPL PHYS L, 79(12), 2001, pp. 1801-1803
Authors:
Palasantzas, G
De Hosson, JTM
Citation: G. Palasantzas et Jtm. De Hosson, Linear growth of thin films under the influence of stress, APPL PHYS L, 78(20), 2001, pp. 3044-3046
Authors:
Kooi, BJ
De Hosson, JTM
Citation: Bj. Kooi et Jtm. De Hosson, Reply to comment on "Reaction layers around SiC particles in Ti: An electron microscopy study", SCR MATER, 43(3), 2000, pp. 287-289
Authors:
Vreeling, JA
Ocelik, V
Hamstra, GA
Pei, YT
De Hosson, JTM
Citation: Ja. Vreeling et al., In-situ microscopy investigation of failure mechanisms in Al/SiCp metal matrix composite produced by laser embedding, SCR MATER, 42(6), 2000, pp. 589-595
Authors:
Van Agterveld, DTL
Palasantzas, G
De Hosson, JTM
Citation: Dtl. Van Agterveld et al., Effects of precipitates in Cu upon impact fracture: An ultra-high-vacuum study with local probe scanning Auger/electron microscopy, ACT MATER, 48(8), 2000, pp. 1995-2004
Authors:
Galindo, RE
Van Veen, A
Garcia, AA
Schut, H
De Hosson, JTM
Citation: Re. Galindo et al., Study of polymer/metal coating under stress using positron annihilation spectroscopy, ACT MATER, 48(18-19), 2000, pp. 4743-4747
Authors:
Carvalho, PA
Sijbolts, M
Kooi, BJ
De Hosson, JTM
Citation: Pa. Carvalho et al., High-resolution transmission electron microscopy study of discontinuously precipitated Ni3Sn, ACT MATER, 48(17), 2000, pp. 4203-4215
Authors:
Vreeling, JA
Ocelik, V
Pei, YT
Van Agterveld, DTL
De Hosson, JTM
Citation: Ja. Vreeling et al., Laser melt injection in aluminum alloys: On the role of the oxide skin, ACT MATER, 48(17), 2000, pp. 4225-4233
Authors:
Palasantzas, G
De Hosson, JTM
Citation: G. Palasantzas et Jtm. De Hosson, Roughness effect on the measurement of interface stress, ACT MATER, 48(14), 2000, pp. 3641-3645
Authors:
Kooi, BJ
De Hosson, JTM
Citation: Bj. Kooi et Jtm. De Hosson, Influence of misfit and interfacial binding energy on the shape of the oxide precipitates in metals; Interfaces between Mn3O4 precipitates and Pd studied with HRTEM, ACT MATER, 48(14), 2000, pp. 3687-3699
Authors:
Pei, YT
De Hosson, JTM
Citation: Yt. Pei et Jtm. De Hosson, Functionally graded materials produced by laser cladding, ACT MATER, 48(10), 2000, pp. 2617-2624
Authors:
Carvalho, PA
Haarsma, HSD
Kooi, BJ
Bronsveld, PM
De Hosson, JTM
Citation: Pa. Carvalho et al., HRTEM study of Co7W6 and its typical defect structure, ACT MATER, 48(10), 2000, pp. 2703-2712
Authors:
Palasantzas, G
Zhao, YP
Wang, GC
Lu, TM
Barnas, J
De Hosson, JTM
Citation: G. Palasantzas et al., Electrical conductivity and thin-film growth dynamics, PHYS REV B, 61(16), 2000, pp. 11109-11117
Authors:
Palasantzas, G
De Hosson, JTM
Citation: G. Palasantzas et Jtm. De Hosson, Fractality aspects during agglomeration of solid-phase-epitaxy Co-silicidethin films, J VAC SCI B, 18(5), 2000, pp. 2472-2476
Authors:
Palasantzas, G
Zhao, YP
De Hosson, JTM
Wang, GC
Citation: G. Palasantzas et al., Roughness effects on magnetic properties of thin films, PHYSICA B, 283(1-3), 2000, pp. 199-202