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Results: 1-10 |
Results: 10

Authors: Hailstone, RK De Keyzer, R
Citation: Rk. Hailstone et R. De Keyzer, A computer simulation study of silver-gold cluster formation on AgBr tabular microcrystals with AgIBr cores, J PHYS CH B, 105(31), 2001, pp. 7533-7541

Authors: Van Renterghem, W Goessens, C Schryver, D Van Landuyt, J Bollen, D De Keyzer, R Van Roost, C
Citation: W. Van Renterghem et al., Influence of twinning on the morphology of AgBr and AgCl microcrystals, J IMAG SC T, 45(4), 2001, pp. 349-356

Authors: Hailstone, RK De Keyzer, R
Citation: Rk. Hailstone et R. De Keyzer, The effect of trap depth on latent-image formation in an AgBr tabular grain: A computer simulation study, J IMAG SC T, 45(4), 2001, pp. 388-392

Authors: Van Renterghem, W Schryvers, D Van Landuyt, J Bollen, D Van Roost, C De Keyzer, R
Citation: W. Van Renterghem et al., A TEM study of non-parallel twins inducing thickness growth in silver chloride {111} tabular crystals, J IMAG SC T, 45(1), 2001, pp. 83-90

Authors: Charlier, E Van Doorselaer, M Gijbels, R De Keyzer, R Geuens, I
Citation: E. Charlier et al., Unveiling the composition of sulfur sensitization specks by their interaction with TAI, J IMAG SC T, 44(3), 2000, pp. 235-241

Authors: Hailstone, RK Vandenbroucke, D De Keyzer, R
Citation: Rk. Hailstone et al., Effect of deep electron traps on contrast in AgCl emulsions, J IMAG SC T, 44(3), 2000, pp. 250-256

Authors: Verlinden, G Gijbels, R Geuens, I De Keyzer, R
Citation: G. Verlinden et al., Surface analysis of halide distributions in complex AgX microcrystals by imaging time-of-flight SIMS (TOF-SIMS), J ANAL ATOM, 14(3), 1999, pp. 429-434

Authors: Belloni, J Treguer, M Remita, H De Keyzer, R
Citation: J. Belloni et al., Enhanced yield of photoinduced electrons in doped silver halide crystals, NATURE, 402(6764), 1999, pp. 865-867

Authors: Gretchikhine, A Schweitzer, G Van der Auweraer, M De Keyzer, R Vandenbroucke, D De Schryver, FC
Citation: A. Gretchikhine et al., Femtosecond transient absorption and luminescence decay studies of spectrally sensitized photographic emulsions, J APPL PHYS, 85(3), 1999, pp. 1283-1293

Authors: Goessens, C Schryvers, D Van Landuyt, J De Keyzer, R
Citation: C. Goessens et al., New method to determine the parity of the number of twin planes in tabularsilver halide microcrystals from top views, J IMAG SC T, 41(3), 1997, pp. 301-307
Risultati: 1-10 |