Authors:
Franke, E
Schubert, M
Trimble, CL
DeVries, MJ
Woollam, JA
Citation: E. Franke et al., Optical properties of amorphous and polycrystalline tantalum oxide thin films measured by spectroscopic ellipsometry from 0.03 to 8.5 eV, THIN SOL FI, 388(1-2), 2001, pp. 283-289
Authors:
Franke, E
Trimble, CL
DeVries, MJ
Woollam, JA
Schubert, M
Frost, F
Citation: E. Franke et al., Dielectric function of amorphous tantalum oxide from the far infrared to the deep ultraviolet spectral region measured by spectroscopic ellipsometry, J APPL PHYS, 88(9), 2000, pp. 5166-5174
Authors:
Gao, X
DeVries, MJ
Thompson, DW
Woollam, JA
Citation: X. Gao et al., Dielectric tensor for interfaces and individual layers in magnetic multilayer structures, J APPL PHYS, 88(5), 2000, pp. 2775-2780